Close Btn

Select Your Regional site

Close

Discontinued Products

Transmission Electron Microscope (TEM)

Scanning Electron Microscope (SEM)

Specimen Preparation Equipment (CP)

MultiBeam System (FIB)

Electron Probe Microanalyzer (EPMA)

Auger Microprobe (Auger)

Photoelectron Spectrometer (ESCA)

X-ray Fluorescence Spectrometer (Benchtop)

Scanning Probe Microscope

Others

Nuclear Magnetic Resonance Spectrometer (NMR)

NMR Probes

Electron Spin Resonance Spectrometer (ESR)

ESR Peripheral Equipment

GC-MS

LC-MS (DART-MS)

MALDI-TOFMS

Defect Review Scanning Electron Microscope (WS)

Electron Beam Lithography System

Thin Film Formation Equipment (E-Beam and Plasma Sources, etc.)

Clinical Chemistry Analyzer (CA)

Amino Acid Analyzer

Close
Notice

Are you a medical professional or personnel engaged in medical care?

Yes

No

Please be reminded that these pages are not intended to provide the general public with information about the products.

DEVELOPMENT /
INSTALLATION CASES

Voices from our users are introduced in the form of interviews, installation cases, and development secrets. You may find some informative hints that can resolve your issue. Please do check them.

Science Basics

Easy explanation about mechanisms and
applications of JEOL products

Contacts

JEOL provides a variety of support services to ensure that our customers can use our products with peace of mind.
Please feel free to contact us.