Discontinued Products
Transmission Electron Microscope (TEM)
Scanning Electron Microscope (SEM)
Specimen Preparation Equipment (CP)
MultiBeam System (FIB)
Electron Probe Microanalyzer (EPMA)
Auger Microprobe (Auger)
Photoelectron Spectrometer (ESCA)
X-ray Fluorescence Spectrometer (Benchtop)
Scanning Probe Microscope
Others
Nuclear Magnetic Resonance Spectrometer (NMR)
NMR Probes
Electron Spin Resonance Spectrometer (ESR)
ESR Peripheral Equipment
GC-MS
LC-MS (DART-MS)
MALDI-TOFMS
Defect Review Scanning Electron Microscope (WS)
Electron Beam Lithography System
Thin Film Formation Equipment (E-Beam and Plasma Sources, etc.)
Clinical Chemistry Analyzer (CA)
Amino Acid Analyzer
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DEVELOPMENT /
INSTALLATION CASES
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Contacts
JEOL provides a variety of support services to ensure that our customers can use our products with peace of mind.
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