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Information on JEOL products used in a wide variety of fields, as well as their supplies and consumables has been requested by many usesrs. Up-to-date information that can satisfy our customers needs are provided in this page.

Scanning Electron Microscope (SEM)

Set of setscrews for FESEM

Dust proof cover for the specimen exchange rod

Specimen holder

Wehnelt Removal Tool

FE-SEM Specimen Exchange chamaber-Installed Case Set

Analysis Kit



JEOL provides a variety of support services to ensure that our customers can use our products with peace of mind.
Please feel free to contact us.