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Supplies

Information on JEOL products used in a wide variety of fields, as well as their supplies and consumables has been requested by many usesrs. Up-to-date information that can satisfy our customers needs are provided in this page.

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Scanning Electron Microscope (SEM)
LC-MS／MS analysis Kit

Scanning Electron Microscope (SEM)

Set of setscrews for FESEM

Dust proof cover for the specimen exchange rod

Specimen holder

Wehnelt Removal Tool

FE-SEM Specimen Exchange chamaber-Installed Case Set

LC-MS／MS analysis Kit

Under preparation.

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JEOL provides a variety of support services to ensure that our customers can use our products with peace of mind.
Please feel free to contact us.

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