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jeolnews_vol.59

jeolnews_vol.59

Electron Microscope General
Magnetic Resonance Spectrometer General
Mass Spectrometer General

Latest Information about Product

Product Group

Transmission Electron Microscope (TEM)

Transmission Electron Microscope (TEM)
Scanning Electron Microscope (SEM)

Scanning Electron Microscope (SEM)
Nuclear Magnetic Resonance Spectrometer (NMR)

Nuclear Magnetic Resonance Spectrometer (NMR)

NMR Peripherals

NMR Magnets

NMR Probes

Software

Electron Spin Resonance Spectrometer (ESR)

ESR Peripherals
Mass Spectrometer (MS)

GC-MS

LC-MS (DART-MS)

MALDI-TOFMS

MS Software
Ion Beam Application Equipment

Specimen Preparation Equipment (CP)

MultiBeam System (FIB)
Instruments for Microarea and Surface Analysis

Electron Probe Microanalyzer (EPMA)

Auger Microprobe (Auger)

Photoelectron Spectrometer (ESCA)
X-ray Fluorescence Spectrometer

X-ray Fluorescence Spectrometer (Benchtop)
Others

Electron Diffractometer

New Products
Discontinued
Products
Catalogue
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Supplies

DEVELOPMENT /
INSTALLATION CASES

Voices from our users are introduced in the form of interviews, installation cases, and development secrets. You may find some informative hints that can resolve your issue. Please do check them.

Development/
Installation Cases

Contacts

JEOL provides a variety of support services to ensure that our customers can use our products with peace of mind.
Please feel free to contact us.

Contacts