Specimen Preparation Equipment (CP)
CROSS SECTION POLISHER™ (CP) is a device to prepare a cross section of a specimen for electron microscopy. Since a cross section is prepared with an ion beam, it is possible to obtain a good quality cross section in a shorter time without individual differences, compared to other methods such as polishing, which requires experience.
Selecting functional holders makes it possible to extend its functions not only of cross section milling but also planar ion milling and ion beam sputter coating. A cooling type CP is also available for handling a thermally labile specimen.
Specimen Preparation Equipment (CP) Lineup
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