MultiBeam System (FIB)
A focused ion beam system is an instrument to mill a specimen using an ion beam at high speed and high precision during observation. It is possible to prepare a specimen for a transmission electron microscope (TEM) by automatic milling and 3D analysis.
A multi-beam system equipped with a scanning electron microscope (SEM) is capable of a variety of analyses by attaching a detector.
MultiBeam System (FIB) Lineup
Products
FIB
FIB Options
Are you a medical professional or personnel engaged in medical care?
No
Please be reminded that these pages are not intended to provide the general public with information about the products.
DEVELOPMENT /
INSTALLATION CASES
Voices from our users are introduced in the form of interviews, installation cases, and development secrets. You may find some informative hints that can resolve your issue. Please do check them.
Contacts
JEOL provides a variety of support services to ensure that our customers can use our products with peace of mind.
Please feel free to contact us.