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MultiBeam System (FIB)

A focused ion beam system is an instrument to mill a specimen using an ion beam at high speed and high precision during observation. It is possible to prepare a specimen for a transmission electron microscope (TEM) by automatic milling and 3D analysis.
A multi-beam system equipped with a scanning electron microscope (SEM) is capable of a variety of analyses by attaching a detector.

MultiBeam System (FIB) Lineup

MultiBeam System (FIB) Lineup

Products

FIB

JIB-4000PLUS Focused Ion Beam Milling & Imaging System

JIB-4000PLUS Focused Ion Beam Milling & Imaging System

JIB-4700F Multi Beam System

JIB-4700F Multi Beam System

FIB Options

IB-07080ATLPS, IB-77080ATLPS Automatic TEM Specimen Preparation System STEMPLING

IB-07080ATLPS, IB-77080ATLPS Automatic TEM Specimen Preparation System STEMPLING

OmniProbe 350 Nano Manipulator inside specimen chamber of FIB-SEM

OmniProbe 350 Nano Manipulator inside specimen chamber of FIB-SEM

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