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Company Profile

Company Profile

Company Profile
( No registration required )

Product Guide

Product Guide

Product Guide
( No registration required )

Transmission Electron Microscope (TEM)

CRYO ARM™ 300 II (JEM-3300) Field Emission Cryo-Electron Microscope

CRYO ARM™ 300 II (JEM-3300) Field Emission Cryo-Electron Microscope

JEM-Z300FSC (CRYO ARM™ 300) Field Emission Cryo-Electron Microscope

JEM-Z300FSC (CRYO ARM™ 300) Field Emission Cryo-Electron Microscope

JEM-Z200FSC (CRYO ARM™ 200) Field Emission Cryo-Electron Microscope

JEM-Z200FSC (CRYO ARM™ 200) Field Emission Cryo-Electron Microscope

JEM-ARM300F2 GRAND ARM™ Atomic Resolution Electron Microscope

JEM-ARM300F2 GRAND ARM™ Atomic Resolution Electron Microscope

JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope

JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope

Monochromated JEM-ARM200F Atomic Resolution Analytical Electron Microscope

Monochromated JEM-ARM200F Atomic Resolution Analytical Electron Microscope

JEM-F200 Multi-purpose Electron Microscope

JEM-F200 Multi-purpose Electron Microscope

JEM-2200FS Field Emission Electron Microscope

JEM-2200FS Field Emission Electron Microscope

EM-2100Plus Electron Microscope

JEM-2100Plus Electron Microscope

JEM-1400Flash Electron Microscope

JEM-1400Flash Electron Microscope

Options (TEM)

SightSKY Camera EM-04500SKY High-Sensitivity, Low-Noise Fiber-Coupling CMOS Camera

SightSKY EM-04500SKY High-Sensitivity, Low-Noise Fiber-Coupling CMOS Camera

OBF System

OBF System

JEM-1400/JEM-1400Plus Upgrading with Flash Camera

JEM-1400/JEM-1400Plus Upgrading with Flash Camera

SAAF Octa Segmented Annular All Field Detector Octa

SAAF Octa Segmented Annular All Field Detector Octa

4DCanvas™ Pixelated STEM Detector

4DCanvas™ Pixelated STEM Detector

4DCanvas™ Application Data book

4DCanvas™ Application Data book

Integrated Dynamic Electron Solutions, Inc. / Products (TEM)

Product Brochure (Integrated Dynamic Electron Solutions, Inc.)

Product Brochure (IDES)

Scanning Electron Microscope (SEM)

FE-SEM

JSM-IT800 Schottky Field Emission Scanning Electron Microscope

JSM-IT800 Schottky Field Emission Scanning Electron Microscope

JSM-IT800 Super Hybrid Lens (SHL) Schottky Field Emission Scanning Electron Microscope

JSM-IT800 Super Hybrid Lens (SHL) Schottky Field Emission Scanning Electron Microscope

JSM-IT800(i)/(is) Schottky Field Emission Scanning Electron Microscope

JSM-IT800(i)/(is) Schottky Field Emission Scanning Electron Microscope

Options (FE-SEM)

SM-92100EUVC EXCIMER UV CLEANER

SM-92100EUVC EXCIMER UV CLEANER

Gather-X JED Series Dry SD™ Windowless EDS

Gather-X JED Series Dry SD™ Windowless EDS

SS-94000SXES/SS-94040SXSER Super Spectrometer

SS-94000SXES/SS-94040SXSER Super Spectrometer

Handbook of Soft X-ray Emission Spectra Version 8.0 (July. 2023)

Handbook of Soft X-ray Emission Spectra Version 8.0 (July. 2023)

Soft X-ray Emission Spectrometer
SXES-LR/ER, -LREP/EREP

Soft X-ray Emission Spectrometer SXES-LR/ER, -LREP/EREP

Conventional SEM

JSM-IT710HR Scanning Electron Microscope

JSM-IT710HR Scanning Electron Microscope

JSM-IT700HR InTouchScope™ Scanning Electron Microscope

JSM-IT700HR InTouchScope™ Scanning Electron Microscope

JSM-IT510 InTouchScope™ Scanning Electron Microscope

JSM-IT510 InTouchScope™ Scanning Electron Microscope

JSM-IT210 Scanning Electron Microscope

JSM-IT210 Scanning Electron Microscope

JSM-IT200 InTouchScope™ Scanning Electron Microscope

JSM-IT200 InTouchScope™ Scanning Electron Microscope

JCM-7000 NeoScope™ Versatile Benchtop SEM

JCM-7000 NeoScope™ Versatile Benchtop SEM

JCM-7000 NeoScope™ Versatile Benchtop SEM

JCM-7000 NeoScope™ Versatile Benchtop SEM

Options (Conventional SEM)

EDS for JSM-IT200 / DrySD™60

EDS for JSM-IT200 / DrySD™60

JCM-7000 NeoScope™ Benchtop Tools for Foreign Material Analysis and Material Determination

JCM-7000 NeoScope™ Benchtop Tools for Foreign Material Analysis and Material Determination

JCM-7000 NeoScope™ Benchtop Tools for Quality Assurance

JCM-7000 NeoScope™ Benchtop Tools for Quality Assurance

Ion Beam Application Equipment (FIB, CP)

MultiBeam System (FIB)

JIB-PS500i FIB-SEM system

JIB-PS500i FIB-SEM system

JIB-4700F Multi Beam System

JIB-4700F Multi Beam System

JIB-4000PLUS Focused Ion Beam Milling & Imaging System

JIB-4000PLUS Focused Ion Beam Milling & Imaging System

Options (FIB)

IB-Z200021CFS, IB-Z200022CPC CRYO-FIB-SEM

IB-Z200021CFS, IB-Z200022CPC CRYO-FIB-SEM

IB-07080ATLPS, IB-77080ATLPS Automatic TEM Specimen Preparation System STEMPLING

IB-07080ATLPS, IB-77080ATLPS Automatic TEM Specimen Preparation System STEMPLING

Specimen Preparation Equipment (CP)

IB-10500HMS CROSS SECTION POLISHER™ High Throughput Milling System

IB-10500HMS CROSS SECTION POLISHER™ High Throughput Milling System

IB-19520CCP CROSS SECTION POLISHER™

IB-19520CCP CROSS SECTION POLISHER™

IB-19530CP CROSS SECTION POLISHER™

IB-19530CP CROSS SECTION POLISHER™

Options (CP)

CROSS SECTION POLISHER™ Precise Positioning Microscope

CROSS SECTION POLISHER™ Precise Positioning Microscope

CROSS SECTION POLISHER™ Precise Positioning Microscope TYPE2

CROSS SECTION POLISHER™ Precise Positioning Microscope TYPE2

Instruments for Microarea and Surface Analysis (EPMA, Auger, XPS, ESCA)

  • EPMA is an abbreviation of Electron Probe Microanalyzer.

Electron Probe Microanalyzer (EPMA)

JXA-iHP200F Schottky field emission Electron Probe Microanalyzer JXA-iSP100 Tungsten/LaB<sub>6</sub> Electron Probe Microanalyzer

JXA-iHP200F Schottky field emission Electron Probe Microanalyzer JXA-iSP100 Tungsten/LaB6Electron Probe Microanalyzer

Options (EPMA)

SS-94000SXES/SS-94040SXSER Super Spectrometer

SS-94000SXES/SS-94040SXSER Super Spectrometer

Handbook of Soft X-ray Emission Spectra Version 8.0 (July. 2023)

Handbook of Soft X-ray Emission Spectra Version 8.0 (July. 2023)

Soft X-ray Emission Spectrometer
SXES-LR/ER, -LREP/EREP

Soft X-ray Emission Spectrometer SXES-LR/ER, -LREP/EREP

Auger Microprobe (Auger)

JAMP-9510F Field Emission Auger Microprobe

JAMP-9510F Field Emission Auger Microprobe

Options (Auger)

Spectrum Image

Spectrum Image

Photoelectron Spectrometer (ESCA)

JPS-9030 Photoelectron Spectrometer (XPS)

JPS-9030 Photoelectron Spectrometer (XPS)

Nuclear Magnetic Resonance Spectrometer(NMR)

JNM-ECZL series FT NMR

JNM-ECZL series FT NMR

JNM-ECZR series FT NMR

JNM-ECZR series FT NMR

JNM-ECZS series FT NMR

JNM-ECZS series FT NMR

Solid State NMR

Solid State NMR

Cryogen Reclamation System

Cryogen Reclamation System

ROYALPROBE™ HFX

ROYALPROBE™ HFX

Data Integrity Compliance of JEOL NMR

Data Integrity Compliance of JEOL NMR

Electron Spin Resonance Spectrometer (ESR)

JES-X3 Series ESR

JES-X3 Series ESR

X-ray Fluorescence Spectrometer (XRF)

JSX-1000S X-ray fluorescence spectrometer (XRF)

JSX-1000S X-ray fluorescence spectrometer (XRF)

Options (XRF)

SX-01020LVC / SX-01030LVC Low Vacuum Capsule for analyzing liquid samples

SX-01020LVC / SX-01030LVC Low Vacuum Capsule for analyzing liquid samples

Mass Spectrometer(MS)

GC-MS

JMS-Q1600GC UltraQuad™ SQ-Zeta Gas Chromatograph Quadrupole Mass Spectrometer

JMS-Q1600GC UltraQuad™ SQ-Zeta Gas Chromatograph Quadrupole Mass Spectrometer

JMS-T2000GC AccuTOF™ GC-Alpha High Performance Gas Chromatograph - Time-of-Flight Mass Spectrometer

JMS-T2000GC AccuTOF™ GC-Alpha High Performance Gas Chromatograph - Time-of-Flight Mass Spectrometer

JMS-TQ4000GC UltraQuad™TQ

JMS-TQ4000GC UltraQuad™TQ

JMS-TQ4000GC for Dioxins

JMS-TQ4000GC for Dioxins

JMS-800D High-Resolution Mass Spectrometer

JMS-800D High-Resolution Mass Spectrometer

JMS-700 MStation Mass Spectrometer

JMS-700 MStation Mass Spectrometer

Options (GC-MS)

msFineAnalysis AI Unknown Compounds Structure Analysis Software

msFineAnalysis AI Unknown Compounds Structure Analysis Software

msFineAnalysis series (GC-MS integrated qualitative analysis software)

msFineAnalysis series (GC-MS integrated qualitative analysis software)

JMS-T2000GC AccuTOF™ GC-Alpha Petroleum and Petrochemical Solutions

JMS-T2000GC AccuTOF™ GC-Alpha Petroleum and Petrochemical Solutions

Comprehensive 2D GC coupled with JEOL GC-HRTOFMS : GCxGC Applications

Comprehensive 2D GC coupled with JEOL GC-HRTOFMS : GCxGC Applications

LC-MS (DART™-MS), MALDI-TOFMS

JMS-T100LP AccuTOF™ LC-Express Atmospheric pressure ionization high-resolution time-of-flight mass spectrometer

JMS-T100LP AccuTOF™ LC-Express Atmospheric pressure ionization high-resolution time-of-flight mass spectrometer

JMS-S3000 SpiralTOF™-plus 2.0 Ultra-High Mass-Resolution MALDI-TOFMS System

JMS-S3000 SpiralTOF™-plus 2.0 Ultra-High Mass-Resolution MALDI-TOFMS System

Options (LC-MS (DART™-MS), MALDI-TOFMS)

msRepeatFinder Polymer Analysis Software

msRepeatFinder Polymer Analysis Software

MALDI-TOFMS imaging system JEOL×SCiLS

MALDI-TOFMS imaging system JEOL×SCiLS

MS Guidebook

GC-MS Soft Ionization Mass_Spectra Collection

GC-MS Soft Ionization Mass_Spectra Collection

Ionization Methods for JEOL Mass Spectrometers - A Guidebook -

Ionization Methods for JEOL Mass Spectrometers - A Guidebook -

Semiconductor Equipment

JBX-8100FS Series Electron Beam Lithography System

JBX-8100FS Series Electron Beam Lithography System

JBX-9500FS Electron Beam Lithography System

JBX-9500FS Electron Beam Lithography System

JBX Series Electron Beam Lithography System

JBX Series Electron Beam Lithography System

Additive Manufacturing Machine (AM)

JAM-5200EBM Electron Beam Metal AM Machine

JAM-5200EBM Electron Beam Metal AM Machine

JEOL Additive Manufacturing New Technical Information

JEOL Additive Manufacturing New Technical Information

Industrial Equipment for thin-film formation and material processing

Industrial Equipment General Catalog

Industrial Equipment General Catalog

Thin Film Formation Equipment (E-Beam and Plasma Sources, etc.)

JEBG BS-60/JST BS-ICE Series Electron Beam Sources and Power Supplies

JEBG BS-60/JST BS-ICE Series Electron Beam Sources and Power Supplies

BS-60610BDS Bombardment Deposition Source

BS-60610BDS Bombardment Deposition Source

BS-60250DEM Electron Beam Source

BS-60250DEM Electron Beam Source

BS-800 Series/BS-920 Series Plasma-Assist Plasma Source/Power Supply

BS-800 Series/BS-920 Series Plasma-Assist Plasma Source/Power Supply

BS-40 Series Rotary Sensor

BS-40 Series Rotary Sensor

JEBG・BS / JST・ST series (JEBG series High-power electron beam sources)

JEBG・BS / JST・ST series (JEBG series High-power electron beam sources)

RF Induction Thermal Plasma System

RF Induction Thermal Plasma System

TP-99140FDR Fine Powder Feeder

TP-99140FDR Fine Powder Feeder

Material Processing Equipment (For Metal Melting and Nanopowder Synthesis, etc.)

RF Induction Thermal Plasma System

RF Induction Thermal Plasma System

TP-400020NPS Thermal Plasma Nanopowder Synthesis System

TP-400020NPS Thermal Plasma Nanopowder Synthesis System

TP-99140FDR Fine Powder Feeder

TP-99140FDR Fine Powder Feeder

JEBG・BS / JST・ST series (JEBG series High-power electron beam sources)

JEBG・BS / JST・ST series (JEBG series High-power electron beam sources)

YOKOGUSHI Application Notes

BatteryNote

BatteryNote

LIBnote

LIBnote

Solid-State Battery Note

Solid-State Battery Note

Cleanliness Inspection Automotive Lithium-ion Batteries Manufacture

Cleanliness Inspection Automotive Lithium-ion Batteries Manufacture

Environmental countermeasure for analytical instruments

Environmental Engineering Technology for Advanced Analytical Instruments

Environmental Engineering Technology for Advanced Analytical Instruments

Room temperature control / Airflow countermeasure

Room temperature control / Airflow countermeasure

Magnetic field countermeasure

Magnetic field countermeasure

Vibration countermeasure

Vibration countermeasure

Contacts

JEOL provides a variety of support services to ensure that our customers can use our products with peace of mind.
Please feel free to contact us.