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Product Guide

Product Guide

Product Guide
( No registration required )

Transmission Electron Microscope (TEM)

CRYO ARM™ 300 II (JEM-3300) Field Emission Cryo-Electron Microscope

CRYO ARM™ 300 II (JEM-3300) Field Emission Cryo-Electron Microscope

JEM-Z300FSC (CRYO ARM™ 300) Field Emission Cryo-Electron Microscope

JEM-Z300FSC (CRYO ARM™ 300) Field Emission Cryo-Electron Microscope

JEM-Z200FSC (CRYO ARM™ 200) Field Emission Cryo-Electron Microscope

JEM-Z200FSC (CRYO ARM™ 200) Field Emission Cryo-Electron Microscope

JEM-ARM300F2 GRAND ARM™ Atomic Resolution Electron Microscope

JEM-ARM300F2 GRAND ARM™ Atomic Resolution Electron Microscope

JEM-ARM300F GRAND ARM™ Atomic Resolution Electron Microscope

JEM-ARM300F GRAND ARM™ Atomic Resolution Electron Microscope

JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope

JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope

Monochromated JEM-ARM200F Atomic Resolution Analytical Electron Microscope

Monochromated JEM-ARM200F Atomic Resolution Analytical Electron Microscope

JEM-F200 Multi-purpose Electron Microscope

JEM-F200 Multi-purpose Electron Microscope

JEM-3200FS Field Emission Energy Filter Electron Microscope

JEM-3200FS Field Emission Energy Filter Electron Microscope

JEM-2200FS Field Emission Electron Microscope

JEM-2200FS Field Emission Electron Microscope

EM-2100Plus Electron Microscope

JEM-2100Plus Electron Microscope

JEM-1400Flash Electron Microscope

JEM-1400Flash Electron Microscope

Options (TEM)

SightSKY Camera EM-04500SKY High-Sensitivity, Low-Noise Fiber-Coupling CMOS Camera

SightSKY Camera EM-04500SKY High-Sensitivity, Low-Noise Fiber-Coupling CMOS Camera

OBF System

OBF System

JEM-1400/JEM-1400Plus Upgrading with Flash Camera

JEM-1400/JEM-1400Plus Upgrading with Flash Camera

SAAF Octa Segmented Annular All Field Detector Octa

SAAF Octa Segmented Annular All Field Detector Octa

4DCanvas™ Pixelated STEM Detector

4DCanvas™ Pixelated STEM Detector

4DCanvas™ Application Data book

4DCanvas™ Application Data book

Integrated Dynamic Electron Solutions, Inc. / Products (TEM)

Product Brochure (Integrated Dynamic Electron Solutions, Inc.)

Product Brochure (Integrated Dynamic Electron Solutions, Inc.)

Scanning Electron Microscope (SEM)

FE-SEM

JSM-IT800 Schottky Field Emission Scanning Electron Microscope

JSM-IT800 Schottky Field Emission Scanning Electron Microscope

JSM-IT800 Super Hybrid Lens (SHL) Schottky Field Emission Scanning Electron Microscope

JSM-IT800 Super Hybrid Lens (SHL) Schottky Field Emission Scanning Electron Microscope

JSM-IT800(i)/(is) Schottky Field Emission Scanning Electron Microscope

JSM-IT800(i)/(is) Schottky Field Emission Scanning Electron Microscope

Options (FE-SEM)

Gather-X JED Series Dry SD™ Windowless EDS

Gather-X JED Series Dry SD™ Windowless EDS

SS-94000SXES/SS-94040SXSER Super Spectrometer

SS-94000SXES/SS-94040SXSER Super Spectrometer

Handbook of Soft X-ray Emission Spectra Version 7.0 (Dec. 2021)

Handbook of Soft X-ray Emission Spectra Version 7.0 (Dec. 2021)

Conventional SEM

JSM-IT510 InTouchScope™ Scanning Electron Microscope

JSM-IT510 InTouchScope™ Scanning Electron Microscope

JSM-IT700HR InTouchScope™ Scanning Electron Microscope

JSM-IT700HR InTouchScope™ Scanning Electron Microscope

JSM-IT500HR InTouchScope™ Scanning Electron Microscope

JSM-IT500HR InTouchScope™ Scanning Electron Microscope

JSM-IT200 InTouchScope™ Scanning Electron Microscope

JSM-IT200 InTouchScope™ Scanning Electron Microscope

JCM-7000 NeoScope™ Versatile Benchtop SEM

JCM-7000 NeoScope™ Versatile Benchtop SEM

JCM-7000 NeoScope™ Versatile Benchtop SEM

JCM-7000 NeoScope™ Versatile Benchtop SEM

Options (Conventional SEM)

EDS for JSM-IT200 / DrySD™60

EDS for JSM-IT200 / DrySD™60

JCM-7000 NeoScope™ Benchtop Tools for Foreign Material Analysis and Material Determination

JCM-7000 NeoScope™ Benchtop Tools for Foreign Material Analysis and Material Determination

JCM-7000 NeoScope™ Benchtop Tools for Quality Assurance

JCM-7000 NeoScope™ Benchtop Tools for Quality Assurance

Ion Beam Application Equipment (FIB, CP)

MultiBeam System (FIB)

JIB-4700F Multi Beam System

JIB-4700F Multi Beam System

JIB-4000PLUS Focused Ion Beam Milling & Imaging System

JIB-4000PLUS Focused Ion Beam Milling & Imaging System

Options (FIB)

IB-07080ATLPS, IB-77080ATLPS Automatic TEM Specimen Preparation System STEMPLING

IB-07080ATLPS, IB-77080ATLPS Automatic TEM Specimen Preparation System STEMPLING

Specimen Preparation Equipment (CP)

IB-10500HMS CROSS SECTION POLISHER™ High Throughput Milling System

IB-10500HMS CROSS SECTION POLISHER™ High Throughput Milling System

IB-19520CCP CROSS SECTION POLISHER™

IB-19520CCP CROSS SECTION POLISHER™

IB-19530CP CROSS SECTION POLISHER™

IB-19530CP CROSS SECTION POLISHER™

Options (CP)

CROSS SECTION POLISHER™ Precise Positioning Microscope

CROSS SECTION POLISHER™ Precise Positioning Microscope

CROSS SECTION POLISHER™ Precise Positioning Microscope TYPE2

CROSS SECTION POLISHER™ Precise Positioning Microscope TYPE2

Instruments for Microarea and Surface Analysis (EPMA, Auger, XPS, ESCA)

  • EPMA is an abbreviation of Electron Probe Microanalyzer.

Electron Probe Microanalyzer (EPMA)

JXA-iHP200F Schottky field emission Electron Probe Microanalyzer JXA-iSP100 Tungsten/LaB<sub>6</sub> Electron Probe Microanalyzer

JXA-iHP200F Schottky field emission Electron Probe Microanalyzer JXA-iSP100 Tungsten/LaB6Electron Probe Microanalyzer

JXA-8530FPlus Field Emission Electron Probe Microanalyzer (FE-EPMA)

JXA-8530FPlus Field Emission Electron Probe Microanalyzer (FE-EPMA)

JXA-8230 Electron Probe Microanalyzer (EPMA)

JXA-8230 Electron Probe Microanalyzer (EPMA)

Options (EPMA)

SS-94000SXES/SS-94040SXSER Super Spectrometer

SS-94000SXES/SS-94040SXSER Super Spectrometer

Auger Microprobe (Auger)

JAMP-9510F Field Emission Auger Microprobe

JAMP-9510F Field Emission Auger Microprobe

Options (Auger)

Spectrum Image

Spectrum Image

Photoelectron Spectrometer (ESCA)

JPS-9030 Photoelectron Spectrometer (XPS)

JPS-9030 Photoelectron Spectrometer (XPS)

Nuclear Magnetic Resonance Spectrometer(NMR)

JNM-ECZL series FT NMR

JNM-ECZL series FT NMR

JNM-ECZR series FT NMR

JNM-ECZR series FT NMR

JNM-ECZS series FT NMR

JNM-ECZS series FT NMR

Solid State NMR

Solid State NMR

ROYALPROBE™ HFX

ROYALPROBE™ HFX

Data Integrity Compliance of JEOL NMR

Data Integrity Compliance of JEOL NMR

Electron Spin Resonance Spectrometer (ESR)

JES-X3 Series ESR

JES-X3 Series ESR

X-ray Fluorescence Spectrometer (XRF)

JSX-1000S X-ray fluorescence spectrometer (XRF)

JSX-1000S X-ray fluorescence spectrometer (XRF)

Mass Spectrometer(MS)

GC-MS, Gas Analysis MS

JMS-Q1600GC UltraQuad™ SQ-Zeta Gas Chromatograph Quadrupole Mass Spectrometer

JMS-Q1600GC UltraQuad™ SQ-Zeta Gas Chromatograph Quadrupole Mass Spectrometer

JMS-T2000GC AccuTOF™ GC-Alpha High Performance Gas Chromatograph - Time-of-Flight Mass Spectrometer

JMS-T2000GC AccuTOF™ GC-Alpha High Performance Gas Chromatograph - Time-of-Flight Mass Spectrometer

JMS-TQ4000GC GC Triple Quadrupole Mass Spectrometer

JMS-TQ4000GC GC Triple Quadrupole Mass Spectrometer

JMS-800D High-Resolution Mass Spectrometer

JMS-800D High-Resolution Mass Spectrometer

JMS-700 MStation Mass Spectrometer

JMS-700 MStation Mass Spectrometer

Options (GC-MS, Gas Analysis MS)

msFineAnalysis series (GC-MS integrated qualitative analysis software)

msFineAnalysis series (GC-MS integrated qualitative analysis software)

JMS-T2000GC AccuTOF™ GC-Alpha Petroleum and Petrochemical Solutions

JMS-T2000GC AccuTOF™ GC-Alpha Petroleum and Petrochemical Solutions

Comprehensive 2D GC coupled with JEOL GC-HRTOFMS : GCxGC Applications

Comprehensive 2D GC coupled with JEOL GC-HRTOFMS : GCxGC Applications

LC-MS (DART™-MS), MALDI-TOFMS

JMS-T100LP AccuTOF™ LC-Express Atmospheric pressure ionization high-resolution time-of-flight mass spectrometer

JMS-T100LP AccuTOF™ LC-Express Atmospheric pressure ionization high-resolution time-of-flight mass spectrometer

JMS-S3000 SpiralTOF™-plus 2.0 Ultra-High Mass-Resolution MALDI-TOFMS System

JMS-S3000 SpiralTOF™-plus 2.0 Ultra-High Mass-Resolution MALDI-TOFMS System

Options (LC-MS (DART™-MS), MALDI-TOFMS)

msRepeatFinder Polymer Analysis Software

msRepeatFinder Polymer Analysis Software

MALDI-TOFMS imaging system JEOL×SCiLS

MALDI-TOFMS imaging system JEOL×SCiLS

Semiconductor Equipment

JBX-8100FS Series Electron Beam Lithography System

JBX-8100FS Series Electron Beam Lithography System

JBX-9500FS Electron Beam Lithography System

JBX-9500FS Electron Beam Lithography System

JBX Series Electron Beam Lithography System

JBX Series Electron Beam Lithography System

Additive Manufacturing Machine (AM)

JAM-5200EBM Electron Beam Metal AM Machine

JAM-5200EBM Electron Beam Metal AM Machine

Industrial Equipment for thin-film formation and material processing

Industrial Equipment General Catalog

Industrial Equipment General Catalog

Thin Film Formation Equipment (E-Beam and Plasma Sources, etc.)

JEBG BS-60/JST BS-ICE Series Electron Beam Sources and Power Supplies

JEBG BS-60/JST BS-ICE Series Electron Beam Sources and Power Supplies

BS-60610BDS Bombardment Deposition Source

BS-60610BDS Bombardment Deposition Source

BS-60250DEM Electron Beam Source

BS-60250DEM Electron Beam Source

BS-800 Series/BS-920 Series Plasma-Assist Plasma Source/Power Supply

BS-800 Series/BS-920 Series Plasma-Assist Plasma Source/Power Supply

BS-40 Series Rotary Sensor

BS-40 Series Rotary Sensor

JEBG・BS / JST・ST series (JEBG series High-power electron beam sources)

JEBG・BS / JST・ST series (JEBG series High-power electron beam sources)

RF Induction Thermal Plasma System

RF Induction Thermal Plasma System

TP-99140FDR Fine Powder Feeder

TP-99140FDR Fine Powder Feeder

Material Processing Equipment (For Metal Melting and Nanopowder Synthesis, etc.)

RF Induction Thermal Plasma System

RF Induction Thermal Plasma System

TP-400020NPS Thermal Plasma Nanopowder Synthesis System

TP-400020NPS Thermal Plasma Nanopowder Synthesis System

TP-99140FDR Fine Powder Feeder

TP-99140FDR Fine Powder Feeder

JEBG・BS / JST・ST series (JEBG series High-power electron beam sources)

JEBG・BS / JST・ST series (JEBG series High-power electron beam sources)

Environmental countermeasure for analytical instruments

Environmental Engineering Technology for Advanced Analytical Instruments

Environmental Engineering Technology for Advanced Analytical Instruments

Room temperature control ・Airflow countermeasure

Room temperature control ・Airflow countermeasure

Magnetic field countermeasure

Magnetic field countermeasure

Vibration countermeasure

Vibration countermeasure

Contacts

JEOL provides a variety of support services to ensure that our customers can use our products with peace of mind.
Please feel free to contact us.