XtaLAB Synergy-ED has realized a seamless flow from measurement to analysis, which can visualize the 3D structure of atoms/molecules using electron beams.
A series of operations from sample selection, diffraction data acquisition, to structure analysis can be easily performed by CrysAlisPro for ED.
This is the outcome of combinations of RIGAKU's ultra-high sensitivity high speed detector"HyPix-ED" and dedicated single crystal structure analysis software "CrysAlisPro for ED" with JEOL’s technologies accumulated through transmission electron microscopes.

Single crystal electron diffraction analysis is not a substitute for single crystal X-ray structure analysis. It is an analytical technique suitable for determination of a small crystal structure which is difficult to measure using X-ray diffraction. This is possible because the interaction between an electron beam and atoms is thousands to tens of thousands stronger than with X-rays. The strong interaction is both an advantage and a disadvantage at the same time. One of the disadvantages is that there is an upper limit in the size (thickness) of crystals that can be measured. The size (thickness) of crystal measurable with 3D ED/MicroED is less than the limit measurable with X-rays. In terms of measurable crystal size, there is no overlapping between the two methods. In fact, they are complementary analysis methods.

3D ED/MicroED using a general-purpose transmission electron microscope requires knowledge and know-how of electron microscopy for setting up for transmission image acquisition and electron diffraction. The operation itself is often difficult for users who are not familiar with electron microscopy. For this reason, the XtaLAB Synergy-ED is specialized in functions as an electron diffractometer rather than an electron microscope, and integrates the CrysAlisPro for ED. This is optimized for electron diffraction, based on the CrysAlisPro, which has an established reputation for X-ray diffraction. The system allows the user to perform everything from crystal selection to data measurement, data processing and structural analysis in a single software package.Researchers who have used single crystal X-ray structure analysis can start analyzing the structure of a substance for which only nano-sized crystals are available immediately after installation.

By integrating the flow from selection of measurement samples (nanocrystals) to data collection and analysis, electron diffraction can be easily used by non-specialists who lack the expertise in electron microscopy and crystallography that is conventionally required.