Transmission Electron Microscope (TEM)
In May 1949, soon after the end of World War II, JEOL was established as a manufacturer of electron microscopes and launched transmission electron microscopes (TEM) for the first time in the world. JEOL continues to be a leading company and supplies the latest TEM to the front line of research activities as a leading company.
This page introduces 120kV TEMs suitable for soft materials, 200/300kV TEMs ranging from general-purpose to high-end models, cryo TEMs and semiconductor TEMs, which are becoming more important in recent years, and attachments of the main units.
TEM for cryo
CRYO ARM™ 300 (CRYO ARM™ 300 (JEM-Z300FSC) Field Emission Cryo-Electron MicroscopeJEM-Z300FSC) Field Emission Cryo-Electron Microscope
TEM for semiconductors
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