SightSKY™ Series
High-Sensitivity, Low-Noise
Fiber-Coupling CMOS Camera

・High-sensitivity, low-noise 19 M pixel CMOS sensor enables imaging of fine specimen detail and obtains high signal to noise images even at low electron doses.
・A Global shutter and high frame rate (58 fps/full pixel mode) enable image series acquisitions with less artifacts during in-situ dynamic observation studies.
・The SightSKY™ camera system offers integration with JEOL’s FEMTUS™ Integrated Analysis Platform, providing user-friendly operation and data acquisition.

Features

High-resolution TEM image of silicon nitride (Si₃N₄)

Digital zoom ensures clear, detailed images even when viewing at atomic resolution.

Instrument: JEM-2100Plus
Accelerating voltage: 200 kV

High-resolution TEM image and electron diffraction pattern of Al₇₂Fe₂₄Ni₄ decagonal quasi-crystal

Digital Zoom enables observation of atomic structure showing quasi-periodicity, such as shown when imaging quasi-crystals. 

Moreover, the high dynamic range offers excellent electron diffraction pattern contrast, from the high-intensity direct spot 0 order spot to weaker-intensity reflections.

Specimen courtesy of:
Dr. Kenji Hiraga, Professor Emeritus,
Institute for Materials Research, Tohoku University
Dr. Kunio Yubuta, Specially Appointed Professor,
Institute for Aqua Regeneration, Shinshu University

Upper right triangle shows Log display.

Instrument: JEM-2100Plus,
Accelerating voltage: 200 kV

TEM images of polycrystalline silicon

Fine structures, such as twin textures of polycrystalline silicon, can be observed with high contrast.

BF-TEM

DF-TEM

A dark-field image is formed with the indicated diffraction spot.

Instrument： JEM-2100Plus
Accelerating voltage： 200 kV

TEM images of MoSi₂-Mo₅Si₃ eutectic alloy

The MoSi₂-Mo₅Si₃ eutectic structure and MoSi₂ and Mo₅Si₃ lattice images can be clearly observed.

Instrument: JEM-F200,
Accelerating voltage: 200 kV,
Specimen preparation: JIB-PS500i

Specimen courtesy of:
Dr. Haruyuki Inui and Dr. Kyosuke Kishida, Professors,
Graduate School of Engineering, Kyoto University

TEM image of polyethylene/polypropylene resin

Digital Zoom enables clear observation of lamella structures

Specimen preparation: Microtome,
Instrument: JEM-2100Plus,
Accelerating voltage: 80 kV

TEM image of Liposome lipid bilayer membrane

The Liposome lipid bilayer membrane can be clearly distinguished.

Specimen preparation: ice-embedding,
Instrument: JEM-F200 (CR),
Accelerating voltage: 200 kV

TEM image of mouse kidney

The renal glomerulus fine structure can be imaged with high contrast allowing for accurate clinical diagnosis.
In particular, important structures in renal biopsy observations, such as the basement membrane and foot processes (arrow), can be clearly imaged at low and high magnification.

Specimen preparation: Microtome,
Instrument: JEM-120i,
Accelerating voltage: 120 kV

Smart Control with JEOL’s FEMTUS™ Integrated Analysis Platform

The camera system is integrated into JEOL’s FEMTUS™ Integrated Analysis Platform and providing user-friendly operation.

Specifications

Catalogue Download

SightSKY (EM-04500SKY) High sensitivity, Low noise fiber coupling CMOS camera

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