Scanning Electron Microscope (SEM)
Scanning electron microscopes (SEM) and its abundant attachments for surface observation and analysis are one of the most active instruments at the R&D institutes and quality test sites in the world.
JEOL can offer a wide range of lineups from general purpose scanning electron microscopes(W-SEM) including a benchtop type that allows operations just to anyone without specific knowledge and techniques, to high-end models of field emission scanning electron microscopes (FE-SEM).
In addition, energy-dispersive X-ray spectrometers (EDS) that are used for elemental analysis are also developed in-house.
Scanning Electron Microscope (SEM) Lineup
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