Electron Probe Microanalyzer (EPMA)
It enables observation of surface tissues and morphology and local trace element analysis. Use of detectors, such as wavelength dispersive X-ray spectrometer (WDS) and soft X-ray spectrometer (SXES), can obtain more detailed measurement results than the energy-dispersive detector (EDS) used with scanning electron microscope (SEM).
JEOL is the only manufacturer in the world who can propose the soft X-ray spectrometer.
Are you a medical professional or personnel engaged in medical care?
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