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Electron Probe Microanalyzer (EPMA)

It enables observation of surface tissues and morphology and local trace element analysis. Use of detectors, such as wavelength dispersive X-ray spectrometer (WDS) and soft X-ray spectrometer (SXES), can obtain more detailed measurement results than the energy-dispersive detector (EDS) used with scanning electron microscope (SEM).
JEOL is the only manufacturer in the world who can propose the soft X-ray spectrometer.

Products

EPMA

JXA-iHP200F Field Emission Electron Probe Microanalyzer (FE-EPMA)

JXA-iHP200F Field Emission Electron Probe Microanalyzer (FE-EPMA)

JXA-iSP100 Electron Probe Microanalyzer (EPMA)

JXA-iSP100 Electron Probe Microanalyzer (EPMA)

EPMA Options

Soft X-ray Emission Spectrometer(SXES)

Soft X-ray EmissionSpectrometer(SXES)

miXcroscopy™ Linked Optical & Scanning Electron Microscopy System

miXcroscopy™ Linked Optical & Scanning Electron Microscopy System

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