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JEOL New Products

JBX-A9 SeriesElectron Beam Lithography System

JEM-120i Electron Microscope

TP-99260FDR Powder Feeder

CRYO-FIB-SEM CryoLameller

JSM-IT210 Scanning Electron Microscope

JSM-IT210 Scanning Electron Microscope

JSM-IT710HR Scanning Electron Microscope

JSM-IT710HR Scanning Electron Microscope

Cryogen Reclamation System

Cryogen Reclamation System

JMS-T2000GC AccuTOF™ GC-Alpha High Performance Gas Chromatograph - Time-of-Flight Mass Spectrometer

JMS-T2000GC AccuTOF™ GC-AlphaHigh Performance Gas Chromatograph- Time-of-Flight Mass Spectrometer

msFineAnalysis AIUnknown CompoundsStructure Analysis Software

JIB-PS500i FIB-SEM system

JNM-ECZL series FT NMR

JNM-ECZL seriesFT NMR

JMS-Q1600GC UltraQuad™ SQ-Zeta Gas Chromatograph Quadrupole Mass Spectrometer

JMS-Q1600GC UltraQuad™ SQ-ZetaGas Chromatograph QuadrupoleMass Spectrometer

CRYO ARM™ 300 II (JEM-3300) Field Emission Cryo-Electron Microscope

CRYO ARM™ 300 II (JEM-3300)Field Emission Cryo-ElectronMicroscope

IB-10500HMS CROSS SECTION POLISHER™ High Throughput Milling system

IB-10500HMSCROSS SECTION POLISHER™High Throughput Milling system

JEM-ARM300F2 GRAND ARM™2 Atomic Resolution Analytical Microscope

JEM-ARM300F2 GRAND ARM™2 Atomic Resolution Analytical Microscope

JAM-5200EBM Electron Beam Metal AM Machine

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