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Latest Number
Applications
Revealing the Latent Atomic World Through Data-Driven Microscopy
Steven R. Spurgeon1, 2, Kayla Yano1, Christina Doty3, Sarah Akers3, and Matthew Olszta1
1 Energy and Environment Directorate, Pacific Northwest National Laboratory
2 Department of Physics, University of Washington
3National Security Directorate, Pacific Northwest National Laboratory
Imaging Zeolite Architecture by High Resolution Scanning Electron Microscopy:
When Physical and Chemical Etching Meet
Zhengxing Qin, Ye Wang1, Natsuko Asano2, Yanfeng Shen1, Valentin Valtchev3,
Shunsuke Asahina2 and Svetlana Mintova1, 3
1 China University of Petroleum (East China), 2 JEOL Ltd.,
3 Normandie Univ, ENSICAEN, UNICAEN, CNRS, Laboratoire Catalyse et Spectrochimie
Low-Dose Atomic-Resolution Observation of Beam-Sensitive Materials via OBF STEM Imaging Technique
Kousuke Ooe1, 2, Takehito Seki2, 3, Yuji Kohno4, Akiho Nakamura4, Yuichi Ikuhara1, 2, Naoya Shibata1, 2
1 Nanostructures Research Laboratory, Japan Fine Ceramics Center 2 Institute of Engineering Innovation, the School of Engineering, the University of Tokyo
3 PRESTO, Japan Science and Technology Agency 4 JEOL Ltd.
Advanced Analytical Methods for the Evaluations of Olefin Polymerization Catalysts
and Produced Polymers
Masayoshi Saito1, Takuo Kataoka1, Masahide Murata2,
Yuhei Nakajima3, Rinya Masuko3, Hiroyuki Yamada3, Hideyuki Takahashi3
1 TOHO TITANIUM CO., LTD. 2 former TOHO TITANIUM CO., LTD. 3 JEOL Ltd.
A Practical Method for the Measurement of 183W NMR Signals in Solution:
Challenge to Multinuclear Solution NMR
Toshiyuki Oshiki Okayama University
Introduction of Various Application Examples Obtained by
Multi-Purpose TEM (JEM-F200) with Various Attachments
Kei-ichi Fukunaga EM Business Unit, JEOL Ltd.
TEM Sample Preparation Using JIB-PS500i and Multi-Purpose FIB-SEM
Misumi Kadoi, Tatsuru Kuramoto, Masateru Shibata, Osamu Suzuki, and Yuichiro Ohori
EP Business Unit, JEOL Ltd.
msFineAnalysis AI Novel Qualitative Analysis Software for JMS-T2000GC with
AI Structural Analysis
Ayumi Kubo MS Business Unit, JEOL Ltd.
He-less Light Element Analysis Using a Low-Vacuum Liquid Sample Capsule by
X-ray Fluorescence Spectrometry
Genki Kinugasa1, Naoki Muraya1 and Hiroshi Onodera2
1 SA Business Unit, JEOL Ltd. 2 EP Business Unit, JEOL Ltd.
