【DISCONTINUED】JSPM-5200 Scanning Probe Microscope
DISCONTINUED
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The Scanning Probe Microscope (SPM) is a versatile microscope that scans the sample surface with a very fine probe and images the topographic shape and physical properties of the surface.
With recent developments in nanotechnology, the SPM has become widely used in various fields.
Features
High resolution allowing observation of atomic and molecular images
The resolution of the SPM is high among various kinds of microscopes. The SPM has a horizontal resolution comparable to the high-resolution TEM and also provides a vertical resolution that surpasses other microscopes.
The SPM enables you to easily observe very fine structures, which are not observed using the SEM, without sample treatment.
Double vibration-isolation using air suspension table and gel damper
The JSPM-5200 offers atomic/molecular resolution images with the help of this isolation mechanism.
Three AFM modes selectable
The JSPM-5200 comes with three AFM modes: Contact mode, AC mode and Non-Contact mode, enabling you to select a suitable mode depending on the sample or the purpose of measurement.
Non-Contact mode is included in the standard configuration.
The JSPM-5200 achieves high-resolution imaging without the apex of the probe contacting the sample surface.
Imaging and measurement of physical quantities of sample surfaces
The SPM is used for not only imaging of topographic shapes of samples but also observation and measurement of various physical quantities.
Various measurement modes
In addition to the standard measurement modes including FFM mode and Phase mode, the JSPM-5200 has optional modes, covering numerous measurements such as surface potential image, magnetic force image and viscoelasticity image.
Flexibility in sample environments
The SPM can control the sample environment. You can use the JSPM-5200 in various environments such as air, vacuum, controlled atmospheres and liquid.
Environmental SPM
JEOL has extended an atmospheric-pressure SPM to an environmental SPM, the JSPM-5200. This SPM flexibly controls the sample environment, enabling you to observe samples not only in vacuum, controlled atmospheres and liquid, but also while heating or cooling them.
Simple, consistent operation
Simple operation with the JSPM-5200 does not change even when you install optional sample heating or cooling accessories in vacuum or in air. The JSPM-5200 is easy to operate in all sample environments.
Simple measurement
You can observe the sample image soon after inserting the sample in the JSPM-5200.
Simple operation by only clicking icon buttons
When you insert the sample in the JSPM-5200, you can easily observe the sample image by just clicking the clearly labeled icon buttons in the measurement software. This measurement software automatically performs all necessary tuning of the components (cantilever, etc.) for measurement.
Image processing→ analysis→ report creation – integrated into one function
The procedures indispensable for SPM measurement, from image processing and analysis to report creation, have been integrated into one function in the measurement software. So, you can speedily carry out these tasks.
Specifications
| Resolution | AFM: Atomic resolution (mica with the contact mode)
STM: Atomic resolution (HOPG atomic image) |
|---|---|
| System drift | 0.05 nm/s or less, drift-free stage available |
| Measurement mode (AFM) | AFM Contact mode
Topography image, Force image Focus curve, Friction force curve, I-V, CITS, Contact current image, SPS mapping AC mode Topography image, Phase image, Amplitude image Point by point MFM Non-Contact mode (FM mode) Topography image, Frequency image |
| Measurement mode (STM) | STM mode
Topography image, Current image, CITS I-V, S-V, I-S |
| Scan range | XY : 0 to 20 μm (standard scanner)
Resolution: 25 bits (including offset) Z : 0 to 3 μm (standard scanner) Resolution: 21 bits (at a gain of ×32) |
| Sample size | Up to 50 mm×50 mm×5 mm (T)
Standard: 10 mm×10 mm×3 mm (T) |
Note) Since the cantilever is not included, contact us when ordering a JSPM-5200.
More Info
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