JSX-3400RII Energy-Dispersive X-Ray Fluorescence Spectrometer
DISCONTINUED
X-ray Fluorescence Spectrometer equipped with high sensitivity,high resolution liquid nitrogen Si (Li) semiconductor detector
Features
JSX-3400RII is the general purpose XRF instrument which is excellent about the cost performance ratio which used a liquid-nitrogen -type detector.
JSX-3400RII employs Si(Li) detector with high sensitivity for heavy elements, the shot-path optical system in the past than the machine and the special filter.JSX-3400RⅡ can measure the trace elements at short time.
The resolution of the detector of JSX-3400RⅡ is high so it can separate the peak of the light elements such as Mg, Al and Si, very cleary.
A quantitative analysis is carried out having no standard substance and simply using the FP method (fundamental parameter method).
Since the collimator of 1 mmphi is equipped standardly, it can analyze also checking a minute foreign substance.
JSX-3400RII has the realistic feature of the sum-peak as the standard and the qualitative analysis is easy.
If the Sum-Peak Removal software of the option is used, we will improve the precision of the quantitative analysis method more.
The thin film FP method can analyze the thickness and composition
of each layer in a multi-layer thin film such as the composite plating, the alloy plating without reference samples.
Specifications
| Detection element range | Na to U |
|---|---|
| X ray generat | 5 to 50kV 1mA 50W |
| Target | Rh |
| Filter | four-position automatic exchange (include open) |
| Collimateror | 1ｍｍ/3ｍｍ/7ｍｍ |
| Detector | Si(Li) semiconductor detector |
| Liquid nitrogen | 3L dewar, consumption 1L/day |
| Sample chamber size | Diameter 300mm x 150mm (H) |
| Atmosphere in sample chamber | Air (vacuum: option) |
| Personal computer | OS:Windows®7
Liquid Crystal Display Color printer |
| Software | RoHS analysis : Plastic 5 element analysis, Metal material 5 element analysis, Analysis result reporting software
Ggeneral analysis: The bulk FP method , The thin film FP method Calibration curve method |
| Maintenance software | Instrrument calibration software , JSX starter |
| Provided samples | Energy calibration sample , Instrument check sample , Intensity standard sample |
Notices:Windows is a registered trademark of Microsoft Corporation in the United States and other countries.
More Info
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