【DISCONTINUED】JCM-5000 NeoScope™ Table Top SEM
DISCONTINUED
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Features
The JCM-5000 NeoScope™ economically complements both optical microscopes and traditional SEMs. The NeoScope™ makes it easy to obtain high magnification images with high resolution and large depth of field using a microscope that is as simple to operate as a digital camera, but has the powerful electron optics of an SEM.
Whether used by trained electron microscopists as a simple screening instrument, or by lab technicians as a higher resolution alternative to the light microscope, the NeoScope™ will help accelerate the pace of research in the life sciences, forensics, and failure analysis of manufacturing materials.
Basic operation of the NeoScope™ is simple with auto focus, auto contrast and auto brightness controls. No special sample preparation, such as coating or drying, is required. The NeoScope™ operates in both low and high vacuum modes and has three settings for accelerating voltage suitable for a variety of applications, all of which can be programmed in special pre-stored recipe files.
NeoScope™ Benchtop SEM Highlights
Compact Benchtop SEM with automated settings for biological and materials samples
High resolution and large depth of field complement optical microscopes or SEM instruments in the lab
X10 -- 20,000 magnification without lens change
Automatic and manual control with pre-stored recipes
High and low vacuum modes
No special sample preparation, such as coating and drying, for conductive and non-conductive samples
Secondary electron and backscattered electron imaging
Three selectable accelerating voltages
Sample loading to imaging in less than three minutes
Easy to learn and operate
Specifications
| Magnification | ×10 to ×40,000 |
|---|---|
| Observation mode | High vacuum mode, Low vacuum mode |
| Electron source | Small cartridge electron source |
| Accelerating voltage | 15kV, 10kV, 5kV |
| Specimen stage | Manual, X 35mm, Y 35mm |
| Maximum specimen size | 70mm Diameter 50mm Height |
| Detector | Secondary electron detector, Backscattered electron detector |
| Data display | Accelerating voltage, magnification, micron bar, micron value |
| Digital image | 1,280ｘ1,024 pixels, bmp, tif, jpg |
| OS | Windows® VISTA、Windows® 7 |
| Automatic operation | Electron source, focus, brightness, contrast, and astigmatism |
| Composition | Main console + RP (20L/min) |
| Main console dimensions | W492ｘD458ｘH434mm |
| Electric power | Single phase AC100V (400VA) 240V (1,100VA)
50Hz/60Hz |
| Room temperature | 15°C to 30°C |
| Humidity | 70％ or less |
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Application
Application JCM-5000
High Angle Backscattered Electrons and Low Angle Backscattered Electrons
More Info
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