JCM-5000 NeoScope™ Table Top SEM

Features

The JCM-5000 NeoScope™ economically complements both optical microscopes and traditional SEMs. The NeoScope™ makes it easy to obtain high magnification images with high resolution and large depth of field using a microscope that is as simple to operate as a digital camera, but has the powerful electron optics of an SEM.

Whether used by trained electron microscopists as a simple screening instrument, or by lab technicians as a higher resolution alternative to the light microscope, the NeoScope™ will help accelerate the pace of research in the life sciences, forensics, and failure analysis of manufacturing materials.

Basic operation of the NeoScope™ is simple with auto focus, auto contrast and auto brightness controls. No special sample preparation, such as coating or drying, is required. The NeoScope™ operates in both low and high vacuum modes and has three settings for accelerating voltage suitable for a variety of applications, all of which can be programmed in special pre-stored recipe files.

NeoScope™ Benchtop SEM Highlights

• Compact Benchtop SEM with automated settings for biological and materials samples

• High resolution and large depth of field complement optical microscopes or SEM instruments in the lab

• X10 -- 20,000 magnification without lens change

• Automatic and manual control with pre-stored recipes

• High and low vacuum modes

• No special sample preparation, such as coating and drying, for conductive and non-conductive samples

• Secondary electron and backscattered electron imaging

• Three selectable accelerating voltages

• Sample loading to imaging in less than three minutes

• Easy to learn and operate

Specifications

• Windows is a registered trademark of Microsoft Corporation in the United States and other countries.

Application

Application JCM-5000

High Angle Backscattered Electrons and Low Angle Backscattered Electrons

Backscattered Electrons

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