Features
Benchtop Scanning Electron Microscope. Intuitive operation is achieved via touch panel and new operation screens. The low vacuum mode is included in the standard configuration, and EDS can be installed, offering a truly multi-functional benchtop SEM
Compact benchtop SEM
Compact size of 325 mm (W) × 490 mm (D) × 430 mm (H)
Sleek exterior design
External appearance does not change even when EDS is installed
Intuitive operation
Designed with easy-to-understand controls and operation screens
Touch panels are adopted to provide more intuitive operation
A wealth of functions
High and Low vacuum modes are standard
Length measurement functions are also standard
Tilt & rotation motor-driven holder can be installed (option)
EDS (elemental analysis device) can be installed (option)
Quick response
Images can be displayed 3 minutes after the instrument is started
One-touch switching between High vacuum and Low vacuum modes
Easy maintenance with a one-piece grid
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Application
Application JCM-6000
High Angle Backscattered Electrons and Low Angle Backscattered Electrons
Gallery
More Info
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