【DISCONTINUED】JSPM-5410 Scanning Probe Microscope
DISCONTINUED
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The Scanning Probe Microscope (SPM) is a versatile microscope that scans the sample surface with a very fine probe and images the topographic shape and physical properties of the surface. With recent developments in nanotechnology, the SPM has become widely used in various fields.
Features
Snap search function
Surface Topographic Observer (STO)※, a technique based on modern control theory, enables high scan speed imaging with minimal distortion of the topographic image compared with conventional techniques.
Commercially-available cantilever can be used (no need of dedicated cantilever)
Example of grating observation
Scan by conventional PID control
Topographic image 50 Hz scana
Precise shape is not obtained.
Scan by STO control method
Topographic image 50 Hz scan
(STO is a technique developed at Yokohama National University)
Revolutionized controller and software
High-voltage amplifier developed by JEOL makes it possible to obtain images with high S/N ratio. Also, the software is easier to use by optimally labeled icon buttons.
Environmental SPM
This SPM supports imaging in various environments such as air, fluid, vacuum, controlled atmospheres (gas introduced) and sample heating/cooling.
Even when optional accessories are installed, operation in air is easy, thus suitable for beginners to experts.
Digital-control Non-Contact mode suitable for imaging soft samples
The JSPM-5410 includes an improved Non-Contact mode for digital control which uses a constant excitation amplitude FM detection method. A new auto gain control (AGC) is incorporated that extends its Non-Contact mode for dissipation imaging.
The JSPM-5410 is the only SPM that comes standard with Non-Contact mode.
Specifications
| Resolution | Within surface: 0.1 nm, Vertical direction: 0.02 nm AFM : Atomic resolution (mica with the contact mode) STM : Atomic resolution (HOPG atomic image) |
|---|---|
| Measurement mode | AFM: NC mode (frequency detection) Topographic image, Frequency shift image, Dissipation image (Option: SKPM, MFM, EFM ) AC mode (amplitude detection) Topographic image, Phase image, Amplitude image (Option: VE-AFM, SKPM, MFM, EFM) Contact mode Topographic image, Force image, Contact current image, FFM (Option: VE-AFM, LM-FFM, PFM, SCFM, UAFM) STM : Topographic image, Current image Spectroscopy : Force curve, Friction force curve, I-V, S-V, I-S, S-I, SPS mapping |
| Scan range using standard scanner | XY : 0 to 20 μm (resolution: 16 bits 3DAC, equivalent to 21bits) Z : 0 to 3 μm (resolution: 22 bits) When a tube scanner is used (exchangeable) Number of pixels : Up to 2048 × 2048 Rectangular scan, Skip scan, Probe auto tracking, Damage-less scan control, Safety high-speed approach |
| Sample size | Up to 50 mm × 50 mm × 5 mm (T) Standard: 10 mm × 10 mm × 3 mm (T) |
More Info
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