JEM-2100 Electron Microscope
DISCONTINUED
The JEM-2100 is a multipurpose, 200 kV analytical electron microscope. Variety of versions is provided to adapt user’s purposes. The JEM-2100, which incorporates an integrated PC system for various functions with excellent cost performance, supports research and development in wide scientific fields, for biology to materials researches.
Features
Multipurpose 200 kV TEM with simple and ease-of-use operability and excellent expandability
Excellent LaB6 electron gun promises excellent performance with a reasonable cost.
Ultrahigh TEM resolution as high as 0.19 nm (in UHR configuration) enables us to perform an observation at atomic resolution.
STEM (Scanning Transmission Electron Microscope: option) function integrated in PC control system enables us to see a scanning image of a sample at nanometer resolution.
EDS (Energy Dispersive X-ray Spectrometer) with a 0.28sr of solid angle (in HR configuration with a 50mm2 detector) performs highly sensitive analysis at nanometer resolution.
Highly stable specimen stage enables us to perform a long term observation and analysis.
Specifications
| Configuration | Ultrahigh resolution※1 (UHR) |
High resolution※1 (HR) |
High specimen tilt※1 (HT) |
Cryo※1 (CR) |
High contrast※1 (HC) |
|---|---|---|---|---|---|
| Resolution(nm) | |||||
| Point | 0.194 | 0.23 | 0.25 | 0.27 | 0.31 |
| Lattice | 0.14 | 0.14 | 0.14 | 0.14 | 0.14 |
| Acc. Voltage | 80，100，120，160，200 kV | ||||
| Minimum step | 50 V | ||||
| Stability | |||||
| Acc. Voltage | 2×10-6／min | ||||
| OL Current | 1×10-6／min | ||||
| Optical parameters for objective lenses | |||||
| Focal length | 1.9 mm | 2.3 mm | 2.7 mm | 2.8 mm | 3.9 mm |
| Spherical aber. coeff. | 0.5 mm | 1.0 mm | 1.4 mm | 2.0 mm | 3.3 mm |
| Chromatic aber. coeff. | 1.1 mm | 1.4 mm | 1.8 mm | 2.1 mm | 3.0 mm |
| Minimum focal step | 1.0 nm | 1.5 nm | 1.8 nm | 2.0 nm | 5.2 nm |
| Spot Size ( in diameter) | |||||
| TEM mode | 20～200 nm | 1 to 5 μm | |||
| EDS mode | 0.5 to 25 nmφ α selector |
1.0 to 25 nmφ α selector |
1.5 to 35 nmφ α selector |
2.0 to 45 nmφ α selector |
10 to 500 nmφ |
| NBD mode | |||||
| CBD mode | |||||
| CB Diffraction | |||||
| Convergent angle （2α） |
1.5 to 20 mrad or more | - | - | ||
| Acceptance angle | ±10° | - | - | ||
| Magnification | |||||
| MAG mode | ×2,000 to 1,500,000 | ×1,500 to 1,200,000 | ×1,200 to 1,000,000 | ×1,000 to 800,000 | |
| LOW MAG mode | ×50 to 6,000 | ×50 to 2,000 | |||
| SA MAG mode | ×8,000 to 800,000 | ×6,000 to 600,000 | ×5,000 to 600,000 | ×5,000 to 400,000 | |
| Camera length | |||||
| SA diff.(mm) | 80 to 2,000 | 100 to 2,500 | 150 to 3,000 | ||
| HD diff.(m) | 4 to 80 | ||||
| Specimen driving system | |||||
| Tilting angle X / Y※2 |
±25/±25° | ±35/±30° | ±42/±30° | ±15/±10° | ±38/±30° |
| Tilting angle X※3 |
±25° | ±80° | ±80° | ±80° | ±80° |
| Shift(mm) | 2 (X,Y) 0.2 (Z±0.1 mm) |
2 (X,Y) 0.4 (Z±0.2 mm) |
|||
| EDS※4 | |||||
| Solid angle (30mm2/50mm2) |
0.13sr／0.24sr | 0.13sr／0.28sr | 0.13sr／0.23sr | ※5 | 0.09sr／－ |
| Take-off angle (30mm2/50mm2) |
25˚／22.3˚ | 25˚／24.1˚ | 25˚／25˚ | ※5 | 20˚／－ |
Specify either configuration (UHR, HR, HT, CR or HC) when ordering the JEM-2100.
With a specimen tilting holder
With a high-tilt specimen holder
An optional EDS is required.
Unavailable to install EDS.
Application
Application JEM-2100
JEM-2100: Applications in Nanotechnology
Gallery
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Specimen：Nb2O5
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Specimen：Kidney Glomerulus of Mouse
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Specimen： Carbon Graphite
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More Info
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