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The JEM-2100 is a multipurpose, 200 kV analytical electron microscope. Variety of versions is provided to adapt user’s purposes. The JEM-2100, which incorporates an integrated PC system for various functions with excellent cost performance, supports research and development in wide scientific fields, for biology to materials researches.


Multipurpose 200 kV TEM with simple and ease-of-use operability and excellent expandability

Excellent LaB6 electron gun promises excellent performance with a reasonable cost.
Ultrahigh TEM resolution as high as 0.19 nm (in UHR configuration) enables us to perform an observation at atomic resolution.
STEM (Scanning Transmission Electron Microscope: option) function integrated in PC control system enables us to see a scanning image of a sample at nanometer resolution.
EDS (Energy Dispersive X-ray Spectrometer) with a 0.28sr of solid angle (in HR configuration with a 50mm2 detector) performs highly sensitive analysis at nanometer resolution.
Highly stable specimen stage enables us to perform a long term observation and analysis.


Configuration Ultrahigh resolution※1
High resolution※1
High specimen tilt※1
High contrast※1
 Point 0.194 0.23 0.25 0.27 0.31
 Lattice 0.14 0.14 0.14 0.14 0.14
Acc. Voltage 80,100,120,160,200 kV
 Minimum step 50 V
 Acc. Voltage 2×10-6/min
 OL Current 1×10-6/min
Optical parameters for objective lenses
 Focal length 1.9 mm 2.3 mm 2.7 mm 2.8 mm 3.9 mm
 Spherical aber. coeff. 0.5 mm 1.0 mm 1.4 mm 2.0 mm 3.3 mm
 Chromatic aber. coeff. 1.1 mm 1.4 mm 1.8 mm 2.1 mm 3.0 mm
 Minimum focal step 1.0 nm 1.5 nm 1.8 nm 2.0 nm 5.2 nm
Spot Size ( in diameter)
 TEM mode 20~200 nm 1 to 5 μm
 EDS mode 0.5 to 25 nmφ
α selector
1.0 to 25 nmφ
α selector
1.5 to 35 nmφ
α selector
2.0 to 45 nmφ
α selector
10 to 500 nmφ
 NBD mode
 CBD mode
CB Diffraction
 Convergent angle
1.5 to 20 mrad or more - -
 Acceptance angle ±10° - -
 MAG mode ×2,000 to 1,500,000 ×1,500 to 1,200,000 ×1,200 to 1,000,000 ×1,000 to 800,000
 LOW MAG mode ×50 to 6,000 ×50 to 2,000
 SA MAG mode ×8,000 to 800,000 ×6,000 to 600,000 ×5,000 to 600,000 ×5,000 to 400,000
Camera length
 SA diff.(mm) 80 to 2,000 100 to 2,500 150 to 3,000
 HD diff.(m) 4 to 80
Specimen driving system
 Tilting angle
 X / Y※2
±25/±25° ±35/±30° ±42/±30° ±15/±10° ±38/±30°
 Tilting angle
±25° ±80° ±80° ±80° ±80°
 Shift(mm) 2 (X,Y)
0.2 (Z±0.1 mm)
2 (X,Y)
0.4 (Z±0.2 mm)
 Solid angle
0.13sr/0.24sr 0.13sr/0.28sr 0.13sr/0.23sr ※5 0.09sr/-
 Take-off angle
25˚/22.3˚ 25˚/24.1˚ 25˚/25˚ ※5 20˚/-
  • Specify either configuration (UHR, HR, HT, CR or HC) when ordering the JEM-2100.

  • With a specimen tilting holder

  • With a high-tilt specimen holder

  • An optional EDS is required.

  • Unavailable to install EDS.


Application JEM-2100


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