JSX-3100RII Energy-Dispersive X-Ray Fluorescence Spectrometer
DISCONTINUED
X-ray Fluorescence Spectrometer equipped with high sensitivity,high resolution liquid nitrogen free Si (Li) semiconductor detector
Features
JSX-3100RII is an X-ray fluorescence spectrometer (XRF) equipped with a high-sensitivity, high-resolution, liquid nitrogen-free Si(Li) detector.
JSX-3100RII equips unique refrigerating machine, which eliminate liquid nitrogen for measurements.
JSX-3100RII equips the re-evacuating system for the X-ray detector, which achieves long-time stable operation.
JSX-3100RII equips high-sensitive Si(Li)detector, short-path optical system, and specialized filters, which enables it to measure trace elements in short time.
JSX-3100RII equips high-resolution SI(Li) detector, which enables it to separate the peaks of light elements such as Mg, Al and Si clearly.
Quantitative analyses can be carried out without any standard substances by the FP method (fundamental parameter method)
JSX-3100RII equips 1-mm diameter collimator and CCD camera as standard, which enables its users to observe and analyze small samples such as foreign substances.
JSX-3100RII equips the sum-peak indication function as standard, which make it easy for its users to carry out qualitative analyses.
In addition, with the optional Sum-peak Removal Software, precision of the quantitative analysis can be improved.
The Thin Film FP method can analyze the thickness and composition of each layer in a multi-layer thin film samples such as composite plating, and alloy plating without standard samples.
The Thin Film FP method is equipped as standard.
Specifications
| Detection element range | Na to U |
|---|---|
| X ray generat | 5 to 50kV 1mA 50W |
| Target | Rh |
| Filter | four-position automatic exchange (include open) |
| Collimateror | 1ｍｍ/3ｍｍ/7ｍｍ |
| Detector | liquid nitrogen free Si(Li) semiconductor detector |
| Liquid nitrogen | not required |
| Sample chamber size | Diameter 300mm x 150mm (H) |
| Atmosphere in sample chamber | Air (vacuum: option) |
| Personal computer | OS:Windows®7
Liquid Crystal Display Color printer |
| Software | RoHS analysis : Plastic 5 element analysis, Metal material 5 element analysis, Analysis result reporting software
Ggeneral analysis: The bulk FP method , The thin film FP method Calibration curve method |
| Maintenance software | Instrrument calibration software , JSX starter |
| Provided samples | Energy calibration sample , Instrument check sample , Intensity standard sample |
Notices:Windows is a registered trademark of Microsoft Corporation in the United States and other countries.
More Info
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