【DISCONTINUED】JSM-IT100 InTouchScope™ Scanning Electron Microscope
DISCONTINUED
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Features
The JSM-IT100, equipped with 50 years of JEOL SEM technologies, is a compact, versatile scanning electron microscope.
Ease of use is a key feature of our successful InTouchScope™ series while maintaining the versatility and expandability expected from a research-grade SEM. This all-in-one SEM is used in a wide range of fields, such as biotechnology and nanotechnology, covering various applications, from materials development, testing, evaluation, and defect analysis to quality control, etc.
With an EDS-embedded model, an easy-to-use software system enables smooth integration of observation, elemental analysis and report generation.
The InTouchScope™ series has been the choice of customers around the world since its release in 2010, with the total number of units shipped exceeded 1,000 before.
Superior Operability
The Touch panel enables comfortable and intuitive operation.
Operations with the operation panel* and mouse are also allowed, thus extending selection of the operations according to the purpose of users.
An easy-to-use software interface allows even inexperienced users to accomplish any task with high efficiency
The JSM-IT100 incorporates a GUI that fully integrates observation to element analysis in one window while SEM/EDS switching can be made with one-click setting. This easy-to-use software interface allows even inexperienced users to accomplish any task with high efficiency.
Perform specimen exchange smoothly by pressing the buttons as indicated by the specimen exchange navigation.
When the motor-drive stage* and stage navigation system* are installed, it is possible to locate a region of interest with the feel of operating an optical microscope.
Installation of the EDS guide ensures that analysis can be performed without any indecision.
The new all-in-one SEM can be equipped with the same options as high-end instruments
Besides low-vacuum mode, even non-conductive materials without any pre-treatment can be imaging and analysing.
In addition to low-vacuum observation and element analysis, the JSM-IT100 accommodates a 5-axis motor drive stage.* An option to extend the accelerating voltage up to 30 kV is also available*
Expanded EDS functions are now included such as: area analysis and line scans
The JSM-IT100 is equipped with a JEOL-made EDS and achieves a fully-integrated GUI that allows SEM/EDS switching in one window.
EDS functions in the award-winning InTouchScope™ series are further strengthened by adding partial area analysis, line scan analysis and mapping filter functions.
Space-saving and easy installation
The JSM-IT100 has a footprint 30% smaller than our predecessors, requiring only about the same space as a benchtop scanning electron microscope.
A 100V power outlet is sufficient for installation and no cooling water is needed, which considerably increases flexibility at the installation site.
Option
Specifications
| Resolution | HV mode: 3 nm(30 kV *1) 4 nm(20 kV)、8 nm(3 kV) 15 nm(1 kV)
LV mode*2: 4 nm(30 kV *1) 5 nm(20kV) |
|---|---|
| Magnification | x5 to x300,000 （on a 128 mm to 96 mm image size） |
| Low vacuum pressure setting range *2 | 10 to 100 Pa |
| Accelerating Voltage | 0.5 kV to 30 kV *1 (53 steps)
0.5 kV to 20 kV (43 steps) |
| Filament | Factory pre-centered tungsten hairpin filament |
| Electron gun | Fully automatic / Manual adjustment available |
| Condenser lens | High precision zoom condenser lens |
| Objective lens | Conical lens |
| Obejective lens aperture | 1 step, fine adjustment along X and Y |
| Astigmatism memory | Available |
| Specimen stage | Eucentric stage
X : 80 mm Y : 40 mm Z : 5 mm to 48 mm Tilt: -10°to + 90°, Rotation: 360° |
| Maximum specimen size | 150 mm dia. |
| Image file | BMP, TIFF, JPEG |
| EDS functions*3 | Spectrum analysis, Qualitative/quantitative analysis, Horizontal line analysis, Multi-point analysis, Element map analysis, Probe tracking |
| Standard Recipe | Available |
| Custom Recipe | EOS system, stage coordinates, vacuum mode, etc |
| Automatic functions | Auto-filament and alignment, ACB, AF, AS, Active tone |
| Evacumation system | Fully automatic, TMP : 1 RP : 1 |
Main options
Accelerating Voltage Extension Kit ( AEK )
Low Vacuum Secondary Electron Detector
Stage Navigation System*4
Chamber Scope
Operation Panel
Movable Aperture (3 steps)
Motor Drive Stage (XY、XYZ、XYR、5 axes)
Silicon Drift Detector (10mm, 30mm, 60mm, 100mm)
Three-Dimensional Image Software (3D Sight)
Table (W: 800mm D: 800mm)
Accelerating Voltage Extension Kit is required
Low Vacuum Kit is required
Stabdard for JSM-IT100 (A)/(LA)
Motor drive stage is required
Gallery
More Info
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