【DISCONTINUED】JXA-8230 Electron Probe Microanalyzer
DISCONTINUED
User-friendly PC-based operation
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The EDS, which is a versatile and easy-to-use X ray detector, can be mounted. A combined WDS snd EDS system provides a seamless and user-friendly environment for analysis.
Features
JEOL has developed a new EPMA(Electron Probe Microanalyzer), that continues a long history of EPMA development extending over neary a half century. The JXA-8230, designed for user-friendly operations, provides for a complete range of analyses through a new, simple to use, PC-based interface. The high-accuracy and fast speeds offered by the JXA-8230 are a result of its sophisicated hardwre developed from JEOL's EPMA technologies refined over neary 50 years. The JXA-8230 is powerful, next-generation, analytical tool that fully meets all of the requirements of an EPMA.
EPMA quick start
Click any point and then an analysis type to start a preset qualitative or quantitative ED or WD analysis
User recipes
Save or recall a frequently used set of analytical conditions for a variety of different sample types. All column, EDS and WDS parameters are included in the recipe.
EDS Capabilities
Digital pulse processor
Spectral mapping (WD/ED, stage and beam scanning)
Fan free SDD (option)
Specifications
| Detectable element range | WDS： (Be)※1) / B～U,EDS: B～U |
|---|---|
| Detectable X-ray range | Detectable wavelength range with WDS : 0.087 to 9.3nm Detectable energy range with EDS : 20keV |
| Number of spectrometers | WDS: Up to 5 selectable, EDS: 1 |
| Maximum specimen size | 100 mm × 100 mm × 50 mm (H) |
| Accelerating voltage | 0.2 to 30 kV (0.1 kV steps) |
| Probe current range | 10-12 to 10-5 A |
| Probe current stability | ±0.05%/h, ±0.3%/12h（W） |
| Secondary electron image resolution | 6nm（W）, 5nm（LaB6）※2 （W.D. 11mm, 30kV） |
| Scanning magnification | × 40 to × 300,000 (W. D. 11 mm) |
| Scanning image resolution | Maximum 5,120 × 3,840 |
| Color display | For EPMA analysis : LCD 1,280×1,024 For SEM operation and EDS analysis : LCD 1,280×1,024 |
With optional analyzing crystal for Be analysis
LaB6 optional
Catalogue Download
JXA-8230 Electron Probe Microanalyzer
Application
Application JXA-8230
Chemical State Analyses by Soft X-ray Emission Spectroscopy
Analysis of Cracks in Brass Piping Parts
Image Processing Techniques for Mapping
Beam size and X-ray emitting area
JXA-8230 Electron Probe Micro Analyzer
More Info
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