Analysis of Cracks in Brass Piping Parts
Identification of source of trouble by XRF and EPMA
In order to understand the cause and minimize the recurrence of a product malfunction, it is necessary to pursue defects at an early stage.
An X-ray fluorescence spectrometer (ED-XRF) can provide fast, non-destructive elemental analysis for any sample state such as solid, liquid, or powder. It can be utilized as a quick screening instrument to track down the source of problems.
An X-ray fluorescence spectrometer (ED-XRF) can provide fast, non-destructive elemental analysis for any sample state such as solid, liquid, or powder. It can be utilized as a quick screening instrument to track down the source of problems.
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