JEM-ARM200F ACCELARM Atomic Resolution Analytical Electron Microscope

Realizing an unprecedented STEM (HAADF) resolution of 0.08 nm

JEM-ARM200F ACCELARM is an Atomic Resolution Analytical Electron Microscope, which boasts an unprecedented STEM-HAADF resolution of 78 pm with a STEM Cs corrector incorporated as standard.

Features

Realizing an unprecedented STEM-HAADF resolution of 78 pm ^*1 guaranteed

The JEM-ARM200F ACCELARM, with a STEM Cs corrector incorporated as standard, and the mechanical and electrical stability enhanced to the utmost limit, achieves an unprecedented STEM-HAADF resolution of 78 pm^*1 and 82 pm ^*2.  And as the Cs-corrected electron probe has a dramatically increased current density, which is one order larger than conventional FE TEMs, the elemental analysis at the atomic-level becomes possible, along with an extremely enhanced throughput.
*1 : with Cold FEG, *2 : with Schottky FEG

Direct observation of atomic column sites of light elements using STEM-ABF imaging

The JEM-ARM200F ACCELARM provides the STEM-ABF imaging mode as standard. This technique visualizes light element column sites in crystalline samples. The STEM-HAADF image is simultaneously observable, since the distance between HAADF and BF detectors are optimized. With the two images, the sites of atomic columns can be easily estimated directly.

Atomic resolution analysis with a large solid angle EDS detector

Elemental analysis served with JEOL's own wide area (100 mm²) Silicon Drift Detector (SDD)^*3 provides high-speed and high-sensitivity of detection. In addition to this, large probe currents in small probe sizes, offered by the large allowable aperture size of probe forming system due to aberration correction, enables spectral acquisition and elemental mapping at atomic resolution.
*3 : option

Observation and analysis with cold FE gun ^*4

The cold FE gun, which uses a new vacuum system, can be put in use immediately after flashing, unlike the previous cold-FE gun. In addition, the electron source is small enough to allow even higher resolution images. The narrow energy spread that is characteristic of the cold FEG enables high energy resolution EELS analysis and also decreases chromatic aberration.
*4 : option

TEM Cs-corrector ^*5

With TEM Cs-corrector, the resolution of TEM image is improved to be 110 pm in the UHR configuration.
*5 : option

Specifications

*1 : Select either configuration when ordering a JEM-ARM200F.
*2 : Select either emitter when ordering a JEM-ARM200F.
*3 : With the optional short-circuit switches for the accelerating tube is available for 80 kV and 100 kV.
*4 : 100 kV, 120 kV and 160 kV are possible with the optional adjustments of Cs correctors.
*5 : With the reinforced specimen tilting holder (EM-01030RSTH) or specimen tilting holder (EM-31630).

Application

Application JEM-ARM200F

CryoNote

BatteryNote

Fast Pixelated Detectors: A New Era for STEM

X-ray, Electron and NMR Crystallography to Structural Determination of Small Organic Molecules

Electronic State Analysis by Monochromated STEM-EELS

Single-molecule atomic-resolution real-time TEM imaging

Atomic-Resolution Characterization Using the Aberration-Corrected JEOL JEM-ARM200CF at the University of Illinois – Chicago

LIBnote

High Resolution Imaging and Spectroscopy Using CS-corrected TEM with Cold FEG JEM-ARM200F

Study of Nanoparticles at UTSA: One Year of Using the First JEM-ARM200F Installed in USA

Gallery

• 
• 
• 
• 

Related Products

Monochromated ARM200F

Double Wien-filter monochromator for JEM-ARM200F is newly developed to realize ultra high energy resolution EELS analysis at atomic-scale.

Relativity Electrostatic subframing System

More Info