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Features
MultiBeam, a new high performance SEM and micro milling FIB, combines the most popular LaB6 electron column in the world with real time milling and monitoring capability. The JIB-4500 MultiBeam delivers high throughput and increased productivity with simultaneous viewing, analysis, and micro milling functions for a variety of applications.
Versatility
Low vacuum operation for imaging non-conductive specimens without coating or alteration
A gas injection system for etching and deposition
A large stage for up to 76mmΦ samples
A multiple port design for all your analytical needs
Productivity
Serial slicing and sampling (S3) for monitoring, slicing, fabrication and reconstructing 3D images
Maximum milling current for high throughput
Standard airlock system for fast sample loading
Stability
Provides stable imaging for milling / monitoring over extended periods of time
High throughput milling of large areas (max milling current 30 nA)
5-axis eucentric goniometer stage
More Info
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