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IPFA 2026 - IEEE 33rd International Symposium on the Physical and Failure Analysis of Integrated Circuits

Date: 2026/04/08

Organized by: IEEE

We will be exhibiting at IPFA 2026. Please stop by the JEOL booth(Booth No. B23)!

   

Date

Mon, Jul 13 – Thu, Jul 16, 2026

Venue

Orchid Main Ballroom,
Level 4, Marina Bay Sands
10 Bayfront Avenue, Singapore 018956
access

Booth number

B23

Contacts

E-mail : jeol_event[at]jeol.co.jp
Demand Generation Div.
JEOL Ltd.

  • Note: please use @ for [at]

Exhibition contents

LazEdge Laser SEM system

JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope

JIB-PS500i FIB-SEM system

JSM-IT810 Schottky Field Emission Scanning Electron Microscope

JSM-IT210 Scanning Electron Microscope

IB-19540CP CROSS SECTION POLISHER™
IB-19550CCP COOLING CROSS SECTION POLISHER™

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