IMC20, The 20th International Microscopy Congress
Date: 2019/01/30
JEOL will be exhibiting at IMC20, which will be held at BEXCO (Busan, Korea) from September 10 (Sun.) to 15 (Fri.),
2023. We will provide useful information on new technologies and practical techniques covering a variety of fields.
In addition, various product information segments will be set up at the venue: mock-up of JEM-ACE200F-TEM for semiconductors, booth seminars, and remote demonstration.
We look forward to seeing you at IMC20.
Date/Venue
Date:
Sunday, September 10 - Friday, September 15, 2023
Venue:
BEXCO, Busan, KOREA
Map
Booth Number:
S03/S04, Hall 1, Exhibition Center 1
Exhibit product information
Booth Seminar
Invited speaker
A journey of Cryo-EMing in Korea
Ji-Joon Song
Professor
Department of Biological Sciences
Korea Advanced Institute of Science and Technology (KAIST)
Daejeon, Korea
He graduated from Seoul National University and earned Ph.D. at Cold Spring Harbor Laboratory and was a research fellow at Harvard Medical School, Massachusetts General Hospital, Boston.
MARS -Exploration of the Nanomagnetic World-
Naoya Shibata
Institute of Engineering Innovation
The University of Tokyo
He received a PhD in Materials Science in 2003 at University of Tokyo. He was a JSPS Research Fellow at Oak Ridge National Laboratory (2003-2004) in USA. Then, He joined the Institute of Engineering Innovation at the University of Tokyo from 2004 and he became a Professor there from 2017. His research focuses on the development of new imaging techniques in scanning transmission electron microscopy and their application to interface studies in materials and devices. He has authored or co-authored more than 300 publications in refereed journals. His honors include Japan Academy Prize (2023). Inoue Prize for Science (2023), JSPS Prize (2019), Richard M. Fulrath Award, the American Ceramic Society (2018), the 5th Nagase Award (2015), the 60th Seto Prize, The Japan Microscopy Society (2015), the 15th Sir Martin Wood Award (2013), the 6th Kazato Prize (2013).
Schedule
Monday, 11 September
|
Time |
Speaker |
Title |
|
10:30～11:00 |
KS Han |
Introducing a Schottky FE-SEM with high operability and a windowless EDS covering all KV range |
|
12:30～13:00 |
Movie style |
Chemical state analysis of Si negative electrode in a charged state using SEM-SXES |
|
13:00～13:30 |
Yuhei Nakajima |
Introduction of JEOL NEW FIB-SEM JIB-PS500i |
|
15:30～16:00 |
Noriaki Endo |
Cutting-edge Technologies of Semiconductor Automated TEM/STEM System ”JEM-ACE200F” |
Tuesday, 12 September
| Time | Speaker | Title |
| 10:30～11:00 | Movie style |
Chemical state analysis of Si negative electrode in a charged state using SEM-SXES |
| 12:30～13:00 | Eiji Okunishi | Introduction of integrated analytical platform ”FEMTUS" |
| 13:00～13:30 |
KAIST Professor Ji-Joon Song |
A journey of Cryo-EMing in Korea |
| 15:30～16:00 | Yuhei Nakajima |
Introduction of JEOL NEW FIB-SEM JIB-PS500i |
Wednesday, 13 September
| Time | Speaker | Title |
| 10:30～11:00 | KS Han | Introducing a Schottky FE-SEM with high operability and a windowless EDS that covers all KV range |
| 12:30～13:00 | Hiroki Hashiguchi | Introduction of New Observational and Analytical Methods with the Latest Attachments |
| 13:00～13:30 |
The University of Tokyo Professor Naoya Shibata |
MARS -Exploration of the Nanomagnetic World- |
| 15:30～16:00 | Yuhei Nakajima | Introduction of JEOL NEW FIB-SEM JIB-PS500i |
Thursday, 14 September
| Time | Speaker | Title |
| 10:30～11:00 | Movie style | Chemical state analysis of Si negative electrode in a charged state using SEM-SXES |
| 12:30～13:00 | KS Han | Introducing a Schottky FE-SEM with high operability and a windowless EDS covering all KV range |
| 13:00～13:30 | Yuhei Nakajima | Introduction of JEOL NEW FIB-SEM JIB-PS500i |
Remote Demo ＆ mock-up exhibits
Remote Demonstration of TEM JEM-ACE200F for semiconductors will be held every day.
JEM-ACE200F High Throughput Analytical Electron Microscope
Monday, 11 September
| Time | Title |
| 12:30～13:30 | JEM-ACE200F High Throughput Analytical Electron Microscope |
Tuesday, 12 September
| Time | Title |
| 12:30～13:30 | JEM-ACE200F High Throughput Analytical Electron Microscope |
Wednesday, 13 September
| Time | Title |
| 12:30～13:30 | JEM-ACE200F High Throughput Analytical Electron Microscope |
Thursday, 14 September
| Time | Title |
| 12:30～13:30 | JEM-ACE200F High Throughput Analytical Electron Microscope |
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Please be reminded that these pages are not intended to provide the general public with information about the products.