multislice method
multislice method
A method for calculating the intensities of transmitted and diffracted waves at the bottom plane of a crystalline specimen when the incident electron beam interacts with the specimen. In the "multislice method," the specimen is assumed to be a stacking of many sufficiently-thin crystalline slices that are parallel to the specimen surface. Incoming electrons are regarded to be scattered by the first slice and undergo a phase change, then propagate down to the next slice. In this manner, the electrons are assumed to repeat scattering and propagation in the subsequent slices and reach the bottom plane of the specimen. Finally, the diffraction amplitudes (intensities) are calculated at this plane.
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