topography

A graphic method that shows three-dimensional configurational data. A backscattered electron image providing a topographic map of a specimen surface, which is obtained with the use of a two-segment detector is called a TOPO image. The term, "topograph," is used as X-ray topograph. Since a lens does not exist for X-rays in a usual sense, the two-dimensional distributions of lattice defects, lattice distortions, impurities, domains, etc., are obtained by taking one-to-one correspondence between the specimen position and diffraction intensity from the position. The obtained image is called an X-ray topograph. (In a TEM, STEM corresponds to this method.) The bright-field/dark-field image can be regarded as a kind of topograph.

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