scanning transmission electron microscope image, STEM image
scanning transmission electron microscope image, STEM image
"Scanning transmission electron microscope (STEM) image" is obtained as follows. A small-sized, focused electron probe is scanned over a thin specimen using the double-deflection system. The intensity of the transmitted wave (or the diffracted wave) exiting from a point on the specimen is detected with an annular detector. Then, the intensities are displayed on a computer monitor as a series of bright spots in synchronism with the scanning electron-probe. The resolution of the STEM image is determined by the probe diameter. The STEM method has two observation modes; bright-field mode and dark-field mode.
Fig. Bright-field (left) and annular dark-field (right) STEM images of Pt catalyst particles on a graphite support.
In a bright-field (BF) image, Pt particles appear dark because the incident electrons are scattered at high-angles. In an annular dark-field (AF) image, Pt particles appear bright or show reversed contrast to the BF image because the scattered electrons at high angles are received by the ADF detector.
Fig. Bright-field (left) and annular dark-field (right) STEM images of Pt catalyst particles on a graphite support.
In a bright-field (BF) image, Pt particles appear dark because the incident electrons are scattered at high-angles. In an annular dark-field (AF) image, Pt particles appear bright or show reversed contrast to the BF image because the scattered electrons at high angles are received by the ADF detector.
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