gentle milling
gentle milling
A surface of a specimen milled by the focused ion beam (FIB) technique or a normal ion milling technique is likely to suffer damage. To remove the damaged layers on the specimen surface, an argon ion beam at a low accelerating voltage of 100 V to 2 kV is used to gently mill the specimen surface. This technique is termed "gentle milling."
Related Term(s)
Term(s) with "gentle milling" in the description
Are you a medical professional or personnel engaged in medical care?
No
Please be reminded that these pages are not intended to provide the general public with information about the products.
