Lowering the Barrier to EBSD: Reliable Measurements with a W‑SEM
Release Date: 2026/03/05
This webinar introduces a practical EBSD workflow using a W‑SEM, demonstrating how reliable EBSD maps can be obtained with the JSM‑IT210 and compact e‑Flash XS detector. We will highlight effective sample preparation with the Cross Section Polisher™ (CP) and present key EBSD examples across metals, ceramics, and electronic materials.
This seminar will be delivered online in an on-demand format, available for a limited time. Enjoy the flexibility to view the content anytime, anywhere during the designated period.
By attending this webinar you will learn…
Crystal orientation analysis using a W-SEM.
Practical examples of EBSD measurements.
Sample preparation methods for EBSD.
Who should attend?
Users who are new to EBSD and want to get started.
Users performing micron‑scale EBSD measurements.
Anyone considering an affordable SEM‑EBSD solution.
Related Products
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Presenter |
Mayu Ishino
EP Application Department 
Kazuki Watanabe
EP Application Department 
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On-Demand Viewing Period |
May 20 (Wed) to May 22 (Fri), 2026
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Fee |
Free |
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Presentation Materials |
You can download these materials after completing the post-presentation survey. |
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Recording |
The recording of the webinar will be posted on the “Webinar Archive" page at a later date. |
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Q&A Session |
There will be no Q&A session following the presentation. |
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Contacts |
E-mail：sales1[at]jeol.co.jp
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Registration
Please register here.
For those who have registered, we will send you information on how to access the video viewing page approximately three days before the scheduled start date. We kindly ask for your patience until then.
Please note that we may not be able to accept registrations from other companies in the same industry.
Are you a medical professional or personnel engaged in medical care?
No
Please be reminded that these pages are not intended to provide the general public with information about the products.