Guidelines for obtaining correct SXE spectra using JEOL's soft X-ray emission spectrometer
Release Date: 2026/01/30
The emission spectra at sub-micron region of a material obtained with a soft X-ray emission spectrometer (SXES) reflects the chemical bonding states of this material and changes slightly in spectral shape. To obtain this information correctly, appropriate sample preparation and analytical condition settings are required. This webinar focuses on common mistakes made by the operator unfamiliar with SXES analysis and provides solutions to these problems.
This seminar will be delivered online in an on-demand format, available for a limited time. Enjoy the flexibility to view the content anytime, anywhere during the designated period.
By attending this webinar you will learn…
A principle and features of SXES
Chemical bonding state analysis using SXES
Sample preparation and sample setting required for SXES analysis
Who should attend?
SXES user
EPMA user
FE-SEM user
Related Products
|
Presenter |
Masaru Takakura
SA Research and Development Department 
|
|---|---|
|
On-Demand Viewing Period |
March 25 (Wed) to March 27 (Fri), 2026
|
|
Fee |
Free |
|
Presentation Materials |
You can download these materials after completing the post-presentation survey. |
|
Recording |
The recording of the webinar will be posted on the “Webinar Archive" page at a later date. |
|
Q&A Session |
There will be no Q&A session following the presentation. |
|
Contacts |
E-mail：sales1[at]jeol.co.jp
|
Registration
This webinar has concluded. The presentation video is now available in our archive. To view the recording, please register below.
Movie
Please enter your information to move to the movie page.
Are you a medical professional or personnel engaged in medical care?
No
Please be reminded that these pages are not intended to provide the general public with information about the products.