Introduction of JPS-9030, suitable for wide-area analysis
Release Date: 2026/01/08
XPS is a technique for qualitative and quantitative analysis of elements present on the surface of a sample, as well as chemical bonding states. JEOL's XPS instrument, JPS-9030, is capable of analyzing a wide area on the millimeter order and is suitable for obtaining average information on samples. In this presentation, we will introduce the features of the JPS-9030 and some application data.
This seminar will be held on the web. You can participate not only from your PC, but also from your smartphone or tablet, as long as you have access to the web. We look forward to your participation.
By attending this webinar you will learn…
Usefulness of Average analysis by JPS-9030
Examples of XPS analysis by JPS-9030
Feature of JPS-9030
Who should attend?
XPS user
Customers who wish to analyze the topmost surface of a sample
Customers who are interested in wide area anlysis by XPS
Related Products
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Presenter |
Muraya Naoki
SA Research and Development Department 
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Date/Period |
February 10, 2026 (Tue) 16:00 to 17:00 JST (Tokyo)
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Fee |
Free |
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Presentation Materials |
You can download these materials after completing the post-presentation survey. |
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Recording |
The recording of the webinar will be posted on the “Webinar Archive" page at a later date. |
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Q&A Session |
There will be no Q&A session following the presentation. |
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Contacts |
E-mail：sales1[at]jeol.co.jp
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Registration
Please register here.
For details on registration and participation, please refer to the PDF.
This webinar will be held via Zoom, which has a test meeting feature, so if you are new to Zoom, please click “Test Zoom” to try it out.
Please note that we may not be able to accept registrations from other companies in the same industry.
Are you a medical professional or personnel engaged in medical care?
No
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