SEMICON® Japan 2021 Hybrid
Date: 2021/12/02
JEOL will exhibit various scientific and metrology instruments including electron microscopes used for failure analysis and process development, as well as electron beam lithography system used for lithography.
We will also have functional demonstrations of the JSM-IT800 (i) / (is)
Organizer: SEMI (Semiconductor Equipment and Materials International)
Official web site
Date / Venue
- Date:
Wednesday, 15 December - Friday, 17 December, 2021 (Open: 10:00 to 17:00) - Venue:
Tokyo Big Sight, East Hall 4
3-11-1 Ariake, Koto-ku, Tokyo 135-0063
Map - Access to Tokyo Big Sight:
Rinkai Line: Approx. 7 minutes' walk from Kokusai-Tenjijo Station
Yurikamome: Approx. 3 minutes' walk from Tokyo Big Sight Station - JEOL Booth:
No.4531
How to register (for SEMICON® Japan)
Please register here in advance(to go to an external site).
Contents of Exhibition
Failure Analysis & Process Development Products
- LIVE Demo JSM-IT800 Field Emission Scanning Electron Microscope
- JEM-ACE200F High Throughput Analytical Electron Microscope
- JCM-7000 NeoScope™ Benchtop SEM
- JSM-IT510 InTouchScope™ Scanning Electron Microscope
- JAMP-9510F Field Emission Auger Microprobe
- JIB-4700F Multi Beam System
- JMS-MT3010HRGA INFITOF Multi-Turn Time-of-Flight Mass Spectrometer
- Introduction of contract analysis service
- Introduction of sharing service
Lithography
Global SEMICON®
We will also exhibit at SEMICON® Taiwan and SEMICON® China.
- SEMICON® Taiwan from December 28 (Tue) to 30 (Thu), 2021
https://www.semicontaiwan.org/en - SEMICON® China from March 23 (Wed) to 25 (Fri), 2022
https://www.semiconchina.org/en
Are you a medical professional or personnel engaged in medical care?
No
Please be reminded that these pages are not intended to provide the general public with information about the products.