Film Thickness by Thin Film FP Method
Measurement Examples on Plating Standard Samples
Introduction
Surface treatments such as plating are applied to parts to impart corrosion resistance, decoration, and functionality. Since the thickness of these films relates to product characteristics, quality, and production cost, it is important to control. JEOL's X-ray fluorescence spectrometer can perform non-destructive measurement of film thickness (up to 5 layers). Using our advanced FP method, standards are not required.
Thin Film Measurement Examples
Au Plating
Sample
Measurement Condition
Voltage：50 kV
Collimator Dia：0.9 mm
Atmosphere： Air
Measurement Time：60 Sec.
Spectrum
Analysis Result
| Certified Value (µm) | Analysis Result (µm) |
|---|---|
| 1.99 | 2.06 |
Ni Plating
Sample
Measurement Condition
Tube Voltage：50 kV
Collimator Dia.：0.9 mm
Atmosphere： Air
Measurement Time：60 Sec
Spectrum
Analysis Result
| Certified Value (µm) | Analysis Result (µm) |
|---|---|
| 0.99 | 1.10 |
Zn Plating
Sample
Measurement Condition
Tube Voltage：50 kV
Collimator Dia.：0.9 mm
Atmosphere：Air
Measurement Time：60 Sec
Spectrum
Analysis Result
| Certified Value (µm) | Analysis Result (µm) |
|---|---|
| 2.61 | 2.81 |
Ag Plating
Sample
Measurement Condition
Tube Voltage：50 kV
Collimator Dia.：0.9 mm
Atmosphere ：Air
Measurement Time：60 Sec.
Spectrum
Analysis Result
| Certified Value (µm) | Analysis Result (µm) |
|---|---|
| 8.97 | 8.89 |
Solutions by field
Related products
Are you a medical professional or personnel engaged in medical care?
No
Please be reminded that these pages are not intended to provide the general public with information about the products.