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Test / Analysis of Foreign Substances on Resin surface by X-ray analysis

Foreign Substances Analysis by XRF and SEM-EDS

Analysis of contaminants contained in or adhered to products can provide important information about the route by which the foreign substance is introduced or source of failure.
As X-ray fluorescence spectrometer (ED-XRF)  can provide fast, non-destructive elemental analysis on any sample type, such as solid, liquid and powder, it can be utilized as an instrument for screening. 
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