Test / Analysis of Foreign Substances on Resin surface by X-ray analysis
Foreign Substances Analysis by XRF and SEM-EDS
Analysis of contaminants contained in or adhered to products can provide important information about the route by which the foreign substance is introduced or source of failure.
As X-ray fluorescence spectrometer (ED-XRF) can provide fast, non-destructive elemental analysis on any sample type, such as solid, liquid and powder, it can be utilized as an instrument for screening.
As X-ray fluorescence spectrometer (ED-XRF) can provide fast, non-destructive elemental analysis on any sample type, such as solid, liquid and powder, it can be utilized as an instrument for screening.
- Please see the PDF file for the additional information.
Another window opens when you click. 
PDF 350KB
Related Products
Solutions by field
Are you a medical professional or personnel engaged in medical care?
No
Please be reminded that these pages are not intended to provide the general public with information about the products.