Close Btn

Select Your Regional site


Ultrahigh-Resolution STEM Analysis of Complex Compounds

JEOLnews Volume 45, Number 1, 2010 Eiji Abe†, Daisuke Egusa, Ryo Ishikawa, and Takehito Seki
Department of Materials Science & Engineering, University of Tokyo

Aberration-correction of the objective lens has been successful in converging the electron beam into sub-Å scale, and the scanning transmission electron microscopy (STEM) now routinely provides a remarkably improved spatial-resolution both for imaging and spectroscopy. Here we demonstrate the powerful use of the ultrahigh-resolution STEM for the analysis of complex compounds,including long-period modulated and aperiodic quasicrystalline structures.
Please see the PDF file for the additional information.

PDF 8.56MB

Are you a medical professional or personnel engaged in medical care?



Please be reminded that these pages are not intended to provide the general public with information about the products.

Science Basics

Easy explanation about mechanisms and
applications of JEOL products


JEOL provides a variety of support services to ensure that our customers can use our products with peace of mind.
Please feel free to contact us.