JMS-S3000 SpiralTOF™ series Polymeric Materials Applications Notebook

This is a compendium of polymeric materials applications notes and JEOL News articles based on the data acquired on JEOL ultra-high mass-resolution MALDI-TOFMS JMS-S3000 SpiralTOF™ series.

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Table of Contents

Co-polymers / Co-oligomers　P1〜

• High-Resolution MALDI-TOFMS Measurement and KMD Analysis for Visualization of Polymers Fractionated by Reversed-Phase LC (MSTips No. 503)
• Analysis of multicomponent polyesters using JMS-S3000 “SpiralTOF™-plus3.0” and Kendrick Mass Defect (KMD) analysis (MSTips No. 484)
• EO/PO composition ratio analysis of EO-PO copolymer using JMS-S3000 "SpiralTOF™-plus3.0" and "msRepeatFinder" (MSTips No. 471)
• Structural analysis of EO-PO copolymers using high-resolution MALDI-TOFMS and NMR (MSTips No. 423)
• Composition analysis of EO-PO copolymers using JMS-S3000 “SpiralTOF™-plus2.0” and “msRepeatFinder V6” (MSTips No. 399)
• “Fraction base” KMD plots for a high molecular weight poly(3-hydroxybutyrate-co-3-hydroxyvalerate) copolyester following its on-plate alkaline degradation and SpiralTOF™ analysis (MSTips No. 284)
• Analysis of EO-PO Random Copolymer by Using a Conventional HPLC and MALDI SpiralTOF™ MS (MSTips No. 203)
• Detailed Structural Characterization of Polymers by MALDI-TOFMS with a Spiral Ion Trajectory (Sato, H., JEOL News, 50, 46-52, 2015)
• MALDI SpiralTOF high-resolution mass spectrometry and Kendrick mass defect analysis applied to the characterization of poly(ethylene-co-vinyl acetate) copolymers (Fouquet, T., Nakamura, S. & Sato, H., Rapid Commun. Mass Spectrom. 30, 973 - 981, 2016)

Polymers / Oligomers　P43〜

• An attempt at end-group analysis of polycarbonates up to 100,000 molecular weight using SEC preparative separation and NewSpiralTOF™ (MSTips No. 527)
• Combining JMS-S3000 "SpiralTOF™-plus3.0" and size exclusion chromatography to analyze the end groups of high dispersity synthetic polymers and visualizing changes in the end groups (MSTips No. 495)
• Assessing UV Degradation of Polymers: A Study of Polyethylene Terephthalate by using MALDI-TOFMS and GC-TOFMS
• Differential analysis of UV degradaed polyethylene terephthalate using JMS-S3000 “SpiralTOF™-plus2.0” and “msRepeatFinder” (MSTips No. 422)
• Structural analysis of polyethylene terephthalates with different crystallinity using JMS-S3000 “SpiralTOF™-plus 2.0” (MSTips No. 407)
• End group analysis of poly(methyl methacrylate) using MALDI-TOFMS and GC-TOFMS (MSTips No. 404)
• Analysis of mPEG5K-Phosphate using JMS-S3000 "SpiralTOF™-plus 2.0" (MSTips No. 402)
• Elemental Composition Determination of Polymer End Groups Using Accurate Mass (MSTips No. 357)
• Structural analysis of anionic surfactants in MALDI negative ion mode using "SpiralTOF™-plus" (MSTips No. 333)
• Analysis of degraded polymethyl methacrylate by UV irradiation using high-resolution MALDI-TOFMS and pyrolysis-GC-QMS (MSTips No. 324)
• Analysis of degraded polystyrene by UV irradiation using high-resolution MALDI-TOFMS and pyrolysis-GC-QMS (MSTips No. 322)
• Structural analysis of polyethylene terephthalate combining an on-plate alkaline degradation method and tandem time-of-flight mass spectrometry (MSTips No. 311)
• “Fraction base” KMD plots for a high molecular weight poly(3-hydroxybutyrate) polyester following its on-plate alkaline degradation and SpiralTOF™ analysis" (MSTips No. 283)
• Visualizing fragmentation channels of polyethylene oxide with different end groups using the JMS-S3000 SpiralTOF™ with TOF-TOF option (MSTips No. 279)
• “Remainders of KM” plot for polymers using msRepeatFinder: Intuitive display of High energy collision induced dissociation mass spectra acquired by SpiralTOF™/TOF (MSTips No. 270)
• “Remainders of KM” plot for polymers using msRepeatFinder: compositional mapping over a broad mass range (MSTips No. 269)
• Analysis of low molecular weight polyethylene with solvent-free method using JMS-S3000 “SpiralTOF™” (MSTips No. 235)
• Analysis of cyanoacrylate adhesive using the JMS-S3000 “SpiralTOF™” ― Application of Kendrick Mass Defect plot analysis ― (MSTips No. 220)
• Measurement of a Dendritic MS Reference Standard
• Analysis of high molecular weight polystyrene standards by using JMS-S3000 SpiralTOF™ with Linear TOF option (MSTips No. 199)
• Measurement of Synthetic Polymers [1]: Polystyrene (MSTips No. 163)
• Measurement of Synthetic Polymers [2]: Polymethyl Methacrylate (MSTips No. 164)
• Measurement of Synthetic Polymers [3]: Polyethylene Glycol (MSTips No. 165)

Polymer Additives　P109〜

• Structure analysis of a polymer additive using high-energy collision-induced dissociation mass spectra acquired by JMS-S3000 with TOF/TOF option (MSTips No. 254)
• MALDI for Polymer Analysis: Synthetic Polymers and Additives (MSTips No. 205)

Mass Spectrometry Imaging　P115〜

• Degradation analysis of polyethylene terephthalate film by UV irradiation using imaging mass spectrometry and scanning electron microscopy (HS05)
• Mass spectrometry imaging for degradation of polyethylene terephthalate by UV irradiation using JMS-S3000 “SpiralTOF™-plus” (MSTips No. 307)
• A mass spectrometry imaging method for visualizing synthetic polymers combined with Kendrick mass defect analysis (MSTips No. 306)
• A mass spectrometry imaging method for visualizing synthetic polymers by using average molecular weight and polydispersity as indices. (MSTips No. 305)
• Mass spectrometry imaging on mixed conductive/non-conductive substrate using JMS-S3000 SpiralTOF™ (MSTips No. 288)
• Analysis of organic compounds on an acrylic plate using JMS-S3000 “SpiralTOF™” (MSTips No. 251)
• Ballpoint Ink Analyses Using LDI Imaging and SEM/EDS Techniques (MSTips No. 204)
• Gunshot Residues (GSR) Analysis by Using MALDI Imaging
• Analysis of Organic Thin Films by the Laser Desorption/Ionization Method Using the JMS-S3000 “SpiralTOF™” (Satoh, T., JEOL News, 49, 81-88, 2014)

Details of the hardware and software　P149〜

• Mass Spectrometry Imaging using the JMS-S3000 “SpiralTOF™-plus” Matrix Assisted Laser Desorption Ionization Time-of-Flight Mass Spectrometer (Takaya Satoh, JEOL News, 55, 70-72, 2020)
• Development of JMS-S3000: MALDI-TOF/TOF Utilizing a Spiral Ion Trajectory (Takaya Satoh, JEOL News, 45, 34-37, 2010)
• Development of peak extraction method from a high-resolution MALDI-TOF mass spectrum by machine learning focusing on peak shape, and an application to synthetic polymer analysis (MSTips No. 352)
• The Relationship between Crystal Condition and Mass Resolving Power, Mass Accuracy (MSTips No. 206)
• High Mass Resolution MALDI-Imaging MS - High Stability of Peak Position during Imaging MS Measurement (MSTips No. 193)

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