Case Studies of Semiconductor Analysis Using AES

Release Date: 2025/10/27

This report introduces case studies of semiconductor analysis using Auger Electron Spectroscopy (AES). AES is a highly surface-sensitive and powerful analytical technique that enables precise characterization of elemental composition and contamination at the nanometer scale. In recent years, the development of Spectrum Imaging has further enhanced AES capabilities, allowing for more detailed and convenient analysis of electronic properties such as bandgap and built-in potential differences. These advancements have made AES an increasingly valuable tool in semiconductor research and manufacturing, contributing to improved failure analysis, thin film evaluation, and process optimization.

This seminar will be delivered online in an on-demand format, available for a limited time. Enjoy the flexibility to view the content anytime, anywhere during the designated period.

By attending this webinar you will learn…

• Latest measurement method of AES

• Latest application data of AES

• Latest software that is easy to use

Who should attend?

• AES user

• Customer interested in electrical state analysis

• Customers engaged in semiconductor failure analysis

Related Products / Application

JAMP-9510F Field Emission Auger Microprobe

Semiconductor (Analysis by Industry)

Presenter	Konomi Ikita SA Reserch and Development Department SA Business Unit SI Business Operations JEOL Ltd.
On-Demand Viewing Period	March 10 (Tue) to March 17 (Tue), 2026 Please note that the dates are based on Japan Standard Time (JST). Kindly check your local time zone when accessing the content.
Fee	Free
Presentation Materials	You can download these materials after completing the post-presentation survey.
Recording	The recording of the webinar will be posted on the “Webinar Archive" page at a later date. We will notify you via our e-newsletter and social media once it becomes available.
Q&A Session	There will be no Q&A session following the presentation.
Contacts	E-mail：sales1[at]jeol.co.jp Demand Generation Div. JEOL Ltd. please use @ for [at]

Registration

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