Application for Semiconducting materials with newly developed AES Spectrum Image
Release Date: 2025/10/27
This report introduces case studies of semiconductor analysis using Auger Electron Spectroscopy (AES). AES is a highly surface-sensitive and powerful analytical technique that enables precise characterization of elemental composition and contamination at the nanometer scale. In recent years, the development of Spectrum Imaging has further enhanced AES capabilities, allowing for more detailed and convenient analysis of electronic properties such as bandgap and built-in potential differences. These advancements have made AES an increasingly valuable tool in semiconductor research and manufacturing, contributing to improved failure analysis, thin film evaluation, and process optimization.
This seminar will be delivered online in an on-demand format, available for a limited time. Enjoy the flexibility to view the content anytime, anywhere during the designated period.
By attending this webinar you will learn…
Latest measurement method of AES
Latest application data of AES
Latest software that is easy to use
Who should attend?
AES user
Customer interested in electrical state analysis
Customers engaged in semiconductor failure analysis
Related Products / Application
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Presenter |
Konomi Ikita
SA Reserch and Development Department
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On-Demand Viewing Period |
March 10 (Tue) to March 17 (Tue), 2026
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Fee |
Free |
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Presentation Materials |
You can download these materials after completing the post-presentation survey. |
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Recording |
The recording of the webinar will be posted on the “Webinar Archive" page at a later date. |
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Q&A Session |
There will be no Q&A session following the presentation. |
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Contacts |
E-mail:sales1[at]jeol.co.jp
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Registration
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