Case Studies of Semiconductor Analysis Using AES

Release Date: 2025/10/27

This report introduces case studies of semiconductor analysis using Auger Electron Spectroscopy (AES). AES is a highly surface-sensitive and powerful analytical technique that enables precise characterization of elemental composition and contamination at the nanometer scale. In recent years, the development of Spectrum Imaging has further enhanced AES capabilities, allowing for more detailed and convenient analysis of electronic properties such as bandgap and built-in potential differences. These advancements have made AES an increasingly valuable tool in semiconductor research and manufacturing, contributing to improved failure analysis, thin film evaluation, and process optimization.

This seminar will be held on the web. You can participate not only from your PC, but also from your smartphone or tablet, as long as you have access to the web. We look forward to your participation.

By attending this webinar you will learn…

• Latest measurement method of AES

• Latest application data of AES

• Latest software that is easy to use

Who should attend?

• AES user

• Customer interested in electrical state analysis

• Customers engaged in semiconductor failure analysis

Related Products / Application

JAMP-9510F Field Emission Auger Microprobe

Semiconductor (Analysis by Industry)

Presenter	Konomi Ikita SA Reserch and Development Department SA Business Unit SI Business Operations JEOL Ltd.
Date/Period	December 26, 2025 (Fri) 16:00 to 17:00 JST (Tokyo)
Fee	Free (Applications will be accepted on a first-come, first-served basis. Please apply as soon as possible)
Presentation Materials	You can download these materials after completing the post-presentation survey.
Recording	The recording of the webinar will be posted on the “Movies from Past JEOL Webinars” page at a later date. We will notify you via our e-newsletter and social media when the recording is posted.
Q&A Session	There will be no Q&A session following the presentation.
Contacts	E-mail：sales1[at]jeol.co.jp Demand Generation Div. JEOL Ltd. please use @ for [at]

Registration

Please register here.

• For details on registration and participation, please refer to the PDF.

• This webinar will be held via Zoom, which has a test meeting feature, so if you are new to Zoom, please click “Test Zoom” to try it out.

• Please note that we may not be able to accept registrations from other companies in the same industry.