Streamlining SEM Workflows with Neo Action - Automated SEM Observation and EDS Analysis Powered by JSM-IT810 -
Release Date: 2025/10/21
The JSM-IT810 is a high-resolution FE-SEM designed to meet the growing demand for automation in SEM workflows. Its new feature, Neo Action, enables fully automated multi-field observation and EDS analysis — including stage movement, condition adjustment, and image acquisition. This webinar introduces Neo Action's capabilities and its application in semiconductor sample analysis, where high throughput and consistent data are essential.
This seminar will be held on the web. You can participate not only from your PC, but also from your smartphone or tablet, as long as you have access to the web. We look forward to your participation.
By attending this webinar you will learn…
How SEM Automation Enhances Workflow Efficiency
Capabilities of Neo Action for Automatic SEM Observation and EDS analysis
Applications in Semiconductor Sample Analysis
Who should attend?
R&D Engineers and Scientists Using SEM
Quality Assurance and Inspection Professionals
Semiconductor and Electronics Industry Specialists
Related Products
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Presenter |
Hayato Takayama SI Business Operations
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Date/Period |
December 9, 2025 (Tue) 8:00 to 8:45 JST (Tokyo)
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Fee |
Free (Applications will be accepted on a first-come, first-served basis. Please apply as soon as possible) |
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Presentation Materials |
You can download these materials after completing the post-presentation survey. |
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Recording |
The recording of the webinar will be posted on the “Webinar Archive” page at a later
date. |
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Q&A Session |
There will be no Q&A session following the presentation. |
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Contacts |
E-mail:sales1[at]jeol.co.jp
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Registration
This webinar has concluded. The presentation video is now available in our archive. To view the recording, please register below.
Movie
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Are you a medical professional or personnel engaged in medical care?
No
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