Introducing the XRF-EPMA Integration System
Release Date: 2025/11/11
Both XRF and EPMA are known as instruments for elemental analysis, but there are differences in the results obtained. By utilizing these differences, more efficient and more accurate measurements can be made. In this presentation, we will first explain the analysis principles and features of XRF and EPMA, and then introduce an example of analysis using a combination of the two instruments. We will also introduce the “EPMA-XRF Integration System,” which allows you to easily set EPMA measurement conditions simply by loading XRF data into EPMA.
This seminar will be held on the web. You can participate not only from your PC, but also from your smartphone or tablet, as long as you have access to the web. We look forward to your participation.
By attending this webinar you will learn…
Application case used by XRF
Usefulness of combining EPMA and XRF
Feature of JSX-1000S
Who should attend?
XRF user
EPMA user
Customers interested in using multiple instruments to perform different types of analysis
Related Products
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Presenter |
Muraya Naoki SA Research and Development Department 
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Date/Period |
December 5, 2025 (Fri) 16:00 to 17:00 JST (Tokyo) |
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Fee |
Free (Applications will be accepted on a first-come, first-served basis. Please apply as soon as possible) |
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Presentation Materials |
You can download these materials after completing the post-presentation survey. |
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Recording |
The recording of the webinar will be posted on the “Movies from Past JEOL Webinars” page at a later
date. |
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Q&A Session |
There will be no Q&A session following the presentation. |
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Contacts |
E-mail：sales1[at]jeol.co.jp
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Registration
This webinar has concluded. The presentation video is now available in our archive. To view the recording, please register below.
Movie
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Are you a medical professional or personnel engaged in medical care?
No
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