From Benchtop to High-End:
JEOL SEMs for Every User and Every
Application
Scanning Electron Microscope (SEM)
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Scanning Electron Microscope (SEM) Lineup
JEOL can offer a wide range of lineups from general purpose scanning electron microscopes(W-SEM) including a
benchtop type that allows operations just to anyone without specific knowledge and techniques, to high-end
models of field emission scanning electron microscopes (FE-SEM).
In addition, energy-dispersive X-ray spectrometers (EDS) that are used for elemental analysis are also developed
in-house.
Solving the Shortage of SEM Operators!
- Neo Action
"Neo Action" enables the SEM to automatically queue up multiple measurement areas and define acquisition parameters such as: incident voltage, signal and adjusting the image. It automates routine tasks from data acquisition to reporting. If you are struggling with a shortage of SEM operators or busy multitasking, this is an essential function!
Continuous acquisition of structures of the same size
Shooting and analyzing at different magnifications within the same field of view
Comparing images and analysis with different incident voltages
SEM models that include Neo Action
Display of EDS spectrum and elemental map is possible all the time even during an SEM observation
JEOL is the only manufacturer that has both in-house EDS and electron microscopes. JEOL
offers EDS developed by JEOL exclusively for each SEM model.
Fully integrated with the SEM operation screen, direct analysis is always possible from the observation screen
even during SEM operation.
※ The movie are examples of the JCM-7000 NeoScope™ table-top scanning electron microscope.
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SEM Series
p1-p2： Schottky Field Emission Scanning Electron Microscope
Introducing the JSM-IT810 series, which showcases the performance of
ultrahigh-resolution FE-SEM.
Features include the Neo Engine for electron beam control, Live EDS, Live 3D, and automated functions.
p3-p4： Versatile, Multipurpose SEMs
Introducing compact and versatile SEMs such as the JCM-7000 and JSM-IT210.
p5-p6： SEM Peripheral Equipment
Introducing peripheral devices such as EDS (DrySD™, Gather-X), SXES, and miXcroscopy™.
About Us
JEOL Ltd.
Since its foundation in 1949, JEOL has been committed to the development of
cutting-edge scientific and metrology instruments, industrial and medical equipment.
Today, many of our
products are used throughout the world and we are highly regarded as a truly global company.
Aiming to
be
a 'top niche company that supports science and technology around the world', we will continue to respond
precisely to the increasingly sophisticated and diverse needs of our customers.