Easy-to-use SEM/EDS just for anyone!

JCM-7000 NeoScope™ Benchtop SEM

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Solving the Shortage of SEM Operators!
- Neo Action

"Neo Action" enables the SEM to automatically queue up multiple measurement areas and define acquisition parameters such as: incident voltage, signal and adjusting the image. It automates routine tasks from data acquisition to reporting. If you are struggling with a shortage of SEM operators or busy multitasking, this is an essential function!

Continuous acquisition of structures of the same size

Shooting and analyzing at different magnifications within the same field of view

Comparing images and analysis with different incident voltages

Seamless transition from Optical to SEM imaging!
- Zeromag & Low-Vacuum Mode

An optical image is automatically acquired when the sample is inserted. Search for the field of view on the optical image, then zoom in on the target to automatically switch to an SEM image. Moving to the observation position is easy for quick SEM image acquisition with a minimal number of steps.

Even after switching to the SEM image, samples can be observed without pretreatment thanks to the standard low-vacuum mode, which also supports non-conductive and moisture-containing samples.

Specimen: Salt

Seamless transition from SEM imaging to EDS Analysis
- Live Analysis & Live Map

With Live Analysis, SEM observation and EDS analysis are no longer separate steps. The X-ray spectrum with the main constituent elements are displayed in Real Time on the observation screen. The JCM-7000 also includes Live Map to view the spatial distribution of the elements in Real Time. Live Map increases the probability of finding the elements of interest as well as detecting unexpected elements.

Screening while performing observation with Live Analysis

Quickly check the element distribution with Live Map

When 2D images are not enough
- Live 3D

The high-sensitivity 4-segmented backscattered electron detector enables 2-pane viewing of a SEM image and a 3D image using Live 3D function. In addition to instantaneous shape determination for samples with complex topographies, depth information can also be acquired.

Specimen: Coin

Images obtained with a 4-segmented backscattered electron detector

Live 3D image

Applications

Metal

For conductive metal specimens, observation of surface details using the secondary electron image can be performed without coating.
With the JCM-7000, details of ductile or brittle fracture can be analyzed, including surface morphology of the fracture, elemental analysis of materials present at the starting point of a fracture, and identification of inclusions in metal.

Ductile or brittle fracture on glass

For the ductile or brittle fracture on transparent glass or plastics, it is difficult to confirm its top-surface state with an optical microscope.
Observation with the SEM makes it easy to find the starting point of a fracture and observe the detailed surface morphology.

Printed circuit board

Low-vacuum mode is suitable for a printed circuit board (composite material). Owing to this mode, SEM observation and analysis can be performed without adding a conductive coating.
The Live 3D function enables an SEM image (BEI, shadow) and a live 3D surface reconstructed image to be displayed simultaneously.

Fibers

For fibers with complex structure, adding a conducting coating is difficult. Low-vacuum mode makes it easy to perform morphological observation as well as analysis of foreign materials.

Food

Low-vacuum mode is effective for observation and analysis of food, which contains a lot of water or fats.
In particular for specimens that are susceptible to heat, the use of an LV cooling holder (option) allows for observation and analysis of the food specimen uncoated while preserving its structure.

Asbestos

SEM/EDS enables determination of the presence or absence of asbestos in building materials by combining the results of morphological observation and compositional (elemental) analysis.
The Live Analysis function makes it possible to check the spectrum while observing the SEM images. This allows accurate, efficient judgment about the presence of asbestos when fibers are discovered.

Powder

It can be difficult to identify the type of powder adhered to a component simply by the color.
With SEM, it is possible to identify the elements* as well as confirm details about the powder's morphology, particle diameter, and adhesion.

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JCM-7000 NeoScope™

  • Improved work efficiency with JCM-7000
  • Easy Operation with JCM-7000
  • Seamless transition from Optical to SEM imaging!
  • Seamless transition from SEM imaging to EDS Analysis
  • Simple report creation and data management
  • Options to extend SEM capabilities
  • Discover a New World with JCM-7000
  • Easy maintenance
  • Peripherals

About Us

JEOL Ltd.

Since its foundation in 1949, JEOL has been committed to the development of cutting-edge scientific and metrology instruments, industrial and medical equipment.
Today, many of our products are used throughout the world and we are highly regarded as a truly global company.
Aiming to be a 'top niche company that supports science and technology around the world', we will continue to respond precisely to the increasingly sophisticated and diverse needs of our customers.