The JEM-3010 is an ultrahigh resolution analytical electron microscope with a point resolution of 0.17nm (UHR Version). The HT Version of this TEM allows for specimen tilt of ±45°.

The JEM-3010 also offers many other advanced features which make it an essential tool in the field of materials science and materials innovation. Among its more outstanding features are a microactive goniometer with motorized 5 axes, a directly coupled ion pump with a bake out function for clean specimen environments, and computer controlled data management and storage.