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   PRODUCTS : Electron Optics : Transmission Electron Microscopes (TEM) : 100/120 kV : JEM-1400  
Electron Optics
Products
  
JEM-1400 Transmission Electron Microscope

JEM-1400The JEM-1400 is a high performance, high contrast, 120kV TEM with excellent imaging and analytical capabilities in one compact, easy-to-use instrument. With an acceleration voltage of 40 to 120kV, the JEM-1400 is suitable for biological, polymer and materials science applications.

The new JENIE™ software included with the JEM-1400 offers a set of tutorials and user guides designed to help beginning microscopists familiarize themselves with the microscope, but also allows experienced users to explore and understand advanced features. The Windows™ GUI is programmed with the latest in Windows™ based technologies and allows remote operation and communication between groups via a TCP/IP connection and a web browser.

The JEM-1400 also supports optional STEM digital imaging/scanning circuitry which displays STEM images (BF/DF) on the standard GUI. An EDS can be added for elemental mapping.

  
JEM-1400 Specifications
  HC
High Contrast
STEM
TEM Mode STEM Mode
Resolution
Lattice Image
Point Image

0.20nm
0.38nm

0.20nm
0.38nm
-
-
Accelerating Voltage
Steps (5)
Variable Steps

40 - 120 kV
33 V min. step
Magnification
Mag Mode
Low Mag Mode
SA Mag Mode

x200-1,200,000
x50-1,000
x2,000-300,000

x200-1,200,000
x50-1,000
x2,000-300,000

x5,000-2,000,000
x120-4,000
-
Specimen Chamber
Specimen per Load
Specimen Tilt Angle (X-axis)

1
±25° (±70° with optional holder
  

Please Note

Not all JEOL products are available in every country. For specific information and more details about JEOL products available in your area, contact your local JEOL office or sales representative. Thank you.

  

 
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