JEOL Ltd. - scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, mass spectrometers, NMR spectrometers, and semiconductor tools.

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Thursday, September 02, 2010
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JEOL provides our customer with high performance, reliable scientific instruments that are used for critical research, investigation, and analysis.

JEOL Regional Web Sites

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Recent News

JMS-S3000: MALDI-TOF (Matrix-Assisted Laser Desorption/Ionization Time of Flight) Mass Spectrometer

Incorporating a New Spiral TOF Ion Optic System Capable of High Resolution Mass Analysis over a Wide Molecular Weight Range

First JEOL JEM-ARM200F Electron Microscope Produces Atomic Resolution Data in Record Time

Demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to quickly power up the first TEM of its kind.

Drastic Improvement in Energy Resolution in EDS Analysis by Transmission Electron Microscope

Realizing Ultra-high Accurate Analysis of Nanostructures by Newly Developed Spectrometer

more...

Welcome to JEOL Ltd.

Thank you for your interest in JEOL Ltd. We are a leading supplier of scanning electron microscopes (SEMs), transmission electron microscopes (TEMs), scanning probe microscopes (SPMs), mass spectrometers, NMR spectrometers, and semiconductor tools for scientific and industrial purposes. We provide applications-specific solutions that advance our customers' diverse objectives — from routine analysis of organic and inorganic specimens to breakthroughs in nanotechnological development.

	ELECTRON OPTICS INSTRUMENTS
	Easy to use, flexible for a variety of applications, and backed by JEOL’s award-winning support, JEOL electron microscopes play an influential role in the development of new products and materials, analysis for quality control and forensic investigations, biological research, and more. more >
	ANALYTICAL INSTRUMENTS
	JEOL analytical instruments serve a variety of needs in the biomedical, pharmaceutical, chemical, and environmental fields. more >
	SEMICONDUCTOR EQUIPMENT
	JEOL offers leading-edge solutions for 200/300mm, nano-fabrication processes, and nanoscience research -- backed by award-winning 24/7 service support and long-term commitment to our customers. more >
	SAMPLE PREPARATION EQUIPMENT
	JEOL produces high precision instruments designed to prepare samples prior to imaging with the SEM or TEM. more >
	MEDICAL EQUIPMENT
	JEOL’s innovative, cost-effective systems for medical diagnoses and analyses integrate routine clinical chemistry, hematology, immunodiagnostics, and laboratory automation. more >
	INDUSTRIAL EQUIPMENT
	JEOL’s advanced electron beam and plasma technologies are used to create high-quality, high-performance optical films and platings. more >
	ENVIRONMENTAL EQUIPMENT
	JEOL X-Ray Fluorescence Spectrometers perform elemental analysis to ensure electric and electronic devices meet regulations for hazardous substances. more >

JEM-ARM200F

JEM-ARM200F, atomic resolution analytical microscope, delivers the highest resolution commercially available in its class with an advanced aberration-corrected TEM technology. Through a rigorous program of development to realize customer's expectations, the JEOL team has produced an entirely new platform of TEM that achieves a guaranteed STEM (HAADF) resolution of 0.08 nm.

[ more ]

New FT-NMR Series

The new ECS series of FT-NMRs achieves the highest sensitivity level in the world with its high performance auto tune probe. The compact system requires half of the installation space of a conventional unit. Advanced software and networking capability plus automatic routines simplify operation.

[ more ]

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