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   PRODUCTS : Semiconductor Equipment : Wafer Inspection SEM : WM-7  
Semiconductor
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WM-7 Wafer Surface Inspector

WM-7The world’s first Violet-LD wafer surface analyzer, the WM-7 offers high performance at a low investment price and low operating cost. The WM-7 Features high accuracy, real-time particle counting for wafers ranging from 50mm to 200mm in diameter.

Features:

  • Violet Laser Diode
  • Wafer sizes ranging from 50 mm to
  • 200mm
  • High performance and small footprint
  • Particle information with higher accuracy provided via realtime
  • counting process
  • A variety of options:
    • automatic detectivity adjustment
    • edge chuck
    • communication with host
  
Please Note

Not all JEOL products are available in every country. For specific information and more details about JEOL products available in your area, contact your local JEOL office or sales representative. Thank you.

  

 
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