Request Product InfoFind a Local OfficeSearch
JEOL - Stability, Performance, Productivity Saturday, February 04, 2012
Login
Register
HOME
       Site Map
       Search
       JEOL Regional Web Sites
ABOUT US
       The Company
       ISO Certification
       Investor Relations
       History
       Milestones
PRODUCTS
       JEOL Products & Resources
          Documents and Downloads
          Image Galleries
       Electron Optics
          Scanning Electron Microscopes (SEM)
             High Vacuum/Low Vaccum
                JSM-6510
                JSM-6510LV
                JSM-6610
                JSM-6610LV
                JCM-5000 NeoScope
                JASM-6200 ClairScope™
                JSM-6010LA InTouchScope™
             Analytical SEM
                JSM-6510A / 6510LA
                JSM-6610A / 6610LA
                JED-2300 / 2300F
             Conventional FE
                JSM-7001F
                JSM-7800F
             Semi-in-Lens FE
                JSM-6701F
                JSM-7500F
                JSM-7600F
          Transmission Electron Microscopes (TEM)
             100/120 kV
                JEM-1400
             200 kV
                JEM-2100F
                JED-2300T
                JEM-2100 LaB6
                JEM-2200FS
                JEM-2500SE
                JEM-2800
                JEM-ARM200F
             300 kV
                JEM-3100F
                JEM-3200FS
                JEM-3200FSC
             Analytical
                Centurio option
          Surface Analysis (SA)
             JAMP-9500F
             JXA-8230
             JXA-8530F
             JPS-9200
             JPS-9010 Series
          MultiBeam (SEM-FIB)
             JIB-4501
             JIB-4601F
       Analytical Instruments
          Mass Spectrometers
             JMS-S3000 SpiralTOF™
             AccuTOF™ DART®
             AccuTOF™ GC
             AccuTOF™ LC
             GCmate™ II
             MStation™
             800D
             Q1000GC
          Nuclear Magnetic Resonance
             ECS
             ECX
             ECA
             Delta™ NMR Software
             CapNMR™ Probe
             Probes
             Magnets
             Sample Changers
          Electron Spin Resonance
             JES-FA100
             JES-FA200
             JES-FA300
       Semiconductor Equipment
          Electron Beam Lithography
             JBX-3050MV
             JBX-5500FS
             JBX-6300FS
             JBX-9300FS
          Wafer Inspection
             JWS-3000
             JFAS-7000BT Beam Tracer
             WM-10
             WM-7S
          Fine Process Inspection
             JEM-9320FIB
             EMU-220/330
       Sample Preparation Equipment
          Cross Section Polisher
          Cross Section Polisher II
          Ion Slicer
          Cryo Ion Slicer
          Vacuum Evaporator
          JIB-4000
       Medical Equipment
          BioMajesty™ Series
             JCA-6010/C
             JCA-BM 6050
             JCA-9130/C
             JCA-BM 2250
             JCA-BM 8000 Series
          Amino Acid Analyzer
             AminoTac™
       Industrial Equipment
          High-Power Electron Beam Source
          Electron Beam Source
             BS-60060DEBS
             BS-60050EBS
             BS-72050ICE Power Supply
             JST-F Series Power Supplies
          Plasma Source
             BS-80011BPG
             BS-80020CPPS
          Rotary Sensor
       Environmental Equipment
          JSX-3100RII
          JSX-3400RII
          800D
          Q1000GC
RESOURCES
       Documents and Downloads
       Image Galleries
       Product Presentations
SERVICE
       Network
       Offices
NEWS & EVENTS
       What's New
       Press Releases
       Events & Shows
       JEOL NEWS Magazine
CONTACT US
       Local & Regional Offices
       Request Product Info
  PRODUCTS : Semiconductor Equipment : Fine Process Inspection  
Semiconductor
Products
  
JEOL Fine Process Inspection

Available Models

Focused Ion Beam:

JEM-9320FIB

200kV TEM:

JEM-2500SE

Mask Measurement:

EMU-220/330 CD-SEM
  

 
  Copyright 2006-2012 JEOL Ltd. | Privacy Statement | Terms Of Use
  Designed & Powered by the Swanzey Internet Group