The ability to produce precision cross sections and thin film specimens is key to critical analysis. JEOL sample preparation equipment produces superior samples for imaging with our extensive line of electron microscopes.

JEOL produces high precision instruments designed to prepare samples prior to imaging with the SEM or TEM. From Focused Ion Beam (FIB) systems for nanometric specimens, to a benchtop cross section polisher for large area samples, we offer a selection of specialized instruments to quickly prepare precise cross sections of semiconductor devices, metals, ceramics, and multi-layer structures.

For coating of non-conductive samples and forming carbon and various metal-deposited films, we offer an extremely clean vacuum evaporator. These and other peripheral equipment compliment JEOL’s comprehensive line of electron microscopes.

Cross Section Polisher , Cross Section Polisher II:
Easy-to-use, sample preparation device for SEM, EPMA, and SAM applications

Ion Slicer: Innovative specimen preparation for TEM / STEM / SEM / EPMA / AUGER

Cryo Ion Slicer: For easy preparation of TEM thin film/SEM cross section samples of heat sensitive materials

Vacuum Evaporator: Clean, oil-free, automatic evacuation system for carbon coating of samples

JIB-4000: Gallium (Ga) liquid metal Focused Ion Beam system